Modeling mark edge jitter in phase change recording - SHEILA, Aparna C; LAMBETH, D. N; SCHLESINGER, T. E (Optical data storage 2000 : 14-17 May, 2000, Whistler, Canada, 2000)
Keywords: Applied sciences; Electronics; Exact sciences and technology; Magnetic and optical mass memories; Storage and reproduction of information; Crystal growth; Waveform; Temperature distribution; Optical disk; Nucleation; Heat equation; Reflecting thin film; Jitter; Layer thickness; Data logging; Phase change materials; Statistical method; Experimental result; Optical recording; Diffusion equation; Simulation model