A Physics-Based Model for ESD Protection Devices With Open Base BJT Configuration

This paper presents a simplified physics-based model for deep-snapback transient voltage suppressor (TVS) devices with open base BJT configuration. The proposed model is able to capture quasistatic IV curve as well as the transient behavior of the TVS including the initial voltage peak and the devic...

Full description

Saved in:
Bibliographic Details
Published in2024 46th Annual EOS/ESD Symposium (EOS/ESD) Vol. 46; pp. 1 - 5
Main Authors Mousavi, Seyed Mostafa, Yan, Xin, Asadi, Reza, Mousavi, Mehdi, Bub, Sergei, Holland, Steffen, Beetner, Daryl G.
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association, Inc 16.09.2024
Subjects
Data models
Delays
Electrostatic discharges
Integrated circuit modeling
Modulation
Physics
Predictive models
Transient analysis
Tuning
Online AccessGet full text
DOI10.23919/EOS/ESD61719.2024.10947612

Cover

Abstract This paper presents a simplified physics-based model for deep-snapback transient voltage suppressor (TVS) devices with open base BJT configuration. The proposed model is able to capture quasistatic IV curve as well as the transient behavior of the TVS including the initial voltage peak and the device turn on delay. A comparison of simulation and measurement results show that the proposed model can predict the quasi-static and transient behavior of an ESD protection device.
AbstractList This paper presents a simplified physics-based model for deep-snapback transient voltage suppressor (TVS) devices with open base BJT configuration. The proposed model is able to capture quasistatic IV curve as well as the transient behavior of the TVS including the initial voltage peak and the device turn on delay. A comparison of simulation and measurement results show that the proposed model can predict the quasi-static and transient behavior of an ESD protection device.
Author Asadi, Reza
Beetner, Daryl G.
Yan, Xin
Bub, Sergei
Mousavi, Mehdi
Mousavi, Seyed Mostafa
Holland, Steffen
Author_xml – sequence: 1
  givenname: Seyed Mostafa
  surname: Mousavi
  fullname: Mousavi, Seyed Mostafa
  email: seyedmostafa.mousavi@mst.edu
  organization: Missouri University of Science and Technology,EMC laboratory,Rolla,MO,65401
– sequence: 2
  givenname: Xin
  surname: Yan
  fullname: Yan, Xin
  organization: Missouri University of Science and Technology,EMC laboratory,Rolla,MO,65401
– sequence: 3
  givenname: Reza
  surname: Asadi
  fullname: Asadi, Reza
  organization: Missouri University of Science and Technology,EMC laboratory,Rolla,MO,65401
– sequence: 4
  givenname: Mehdi
  surname: Mousavi
  fullname: Mousavi, Mehdi
  organization: Missouri University of Science and Technology,EMC laboratory,Rolla,MO,65401
– sequence: 5
  givenname: Sergei
  surname: Bub
  fullname: Bub, Sergei
  organization: Nexperia Germany GmbH,Hamburg,Germany,22529
– sequence: 6
  givenname: Steffen
  surname: Holland
  fullname: Holland, Steffen
  organization: Nexperia Germany GmbH,Hamburg,Germany,22529
– sequence: 7
  givenname: Daryl G.
  surname: Beetner
  fullname: Beetner, Daryl G.
  organization: Missouri University of Science and Technology,EMC laboratory,Rolla,MO,65401
BookMark eNo1jz1PwzAYhI0EA5T-AwZLzEn97Xhs0_ClohQ1EmPl2K-ppRJXSUDqv6cVMN0Nd4_ubtBllzpA6J6SnHFDzayqN7Nqs1RUU5MzwkROiRFaUXaBpkYXVBaSay65ukZvc7zeHYfohmxhB_D4NXnY45B6fELgdZ9GcGNMHV7Cd3Qw4Pc47nB9gA6fC3jx0uAydSF-fPX2HLxFV8HuB5j-6QQ1D1VTPmWr-vG5nK-yaPiYGSU9K8hpnNCtDd464oQCra0kzDgXqG2FocQRoYyFQkAQXnKvTds6cnITdPeLjQCwPfTx0_bH7f9R_gPqrE20
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.23919/EOS/ESD61719.2024.10947612
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore Digital Library
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Physics
EISBN 9781585373536
1585373532
EndPage 5
ExternalDocumentID 10947612
Genre orig-research
GrantInformation_xml – fundername: National Science Foundation (NSF)
  grantid: IIP-1916535
  funderid: 10.13039/100000001
GroupedDBID 6IE
6IL
CBEJK
RIE
RIL
ID FETCH-LOGICAL-i93t-965d28002447bafdac0c46e77a5029ccf1ab4910c0469ae84ef4d53d79bbc0d53
IEDL.DBID RIE
IngestDate Wed Apr 16 07:08:46 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i93t-965d28002447bafdac0c46e77a5029ccf1ab4910c0469ae84ef4d53d79bbc0d53
PageCount 5
ParticipantIDs ieee_primary_10947612
PublicationCentury 2000
PublicationDate 2024-Sept.-16
PublicationDateYYYYMMDD 2024-09-16
PublicationDate_xml – month: 09
  year: 2024
  text: 2024-Sept.-16
  day: 16
PublicationDecade 2020
PublicationTitle 2024 46th Annual EOS/ESD Symposium (EOS/ESD)
PublicationTitleAbbrev EOS/ESD
PublicationYear 2024
Publisher EOS/ESD Association, Inc
Publisher_xml – name: EOS/ESD Association, Inc
Score 1.8858877
Snippet This paper presents a simplified physics-based model for deep-snapback transient voltage suppressor (TVS) devices with open base BJT configuration. The...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Data models
Delays
Electrostatic discharges
Integrated circuit modeling
Modulation
Physics
Predictive models
Transient analysis
Tuning
Title A Physics-Based Model for ESD Protection Devices With Open Base BJT Configuration
URI https://ieeexplore.ieee.org/document/10947612
Volume 46
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEA5aUDz5qvgmoNdtd9vspjlaWykFq9KKvZU8JlqUrej24q93JtsqCoKnHRaGhCQ7j833zTB2nnqM443QUWKkxwRFoh10hHX1mZbSixZo4g5fD7LeveiP0_GCrB64MAAQwGdQIzHc5buZndOvMvzClcC0Gy3uKp6zkqy1zs4CnFklqt69Gda7ww465YQ4KA1RW2r86J0SXMfVJhssBy0RI8-1eWFq9uNXPcZ_z2qLVb9Zevz2y_9ssxXId9hagHTa9112d8EXctRGV-U4tT174Rikcpw9aRYBhpXzDgRzwR-mxRMnhAknBd7ujzgNNX2cl8ekykZX3dFlL1o0UIimqllEKktdgwJCIaTR3mkbW5GBlDqNG8pan2gjMFywlCNraAnwwqVNJ5UxNkZpj1XyWQ77jIMDY1InPT6E8rEGl0mq_ZUpEJjVHLAqLczktSyRMVmuyeEf74_YBu0PAS-S7JhVirc5nKB3L8xp2NVPUo2k3Q
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEN4YjI-TL4xvN9FrgcK2yx5FIIiAGmrkRvapRFOMlou_3pktaDQx8dRJk8ludtv5ZtrvmyXkPHKQxysmg1BxBwUKhzhokOvqYsm5Y3UrUTvcH8Sde9YdRaO5WN1rYay1nnxmS2j6f_lmqmf4qQzecMGg7IaIuwzAz6JcrrVKzjyhWYSi3LoZllvDJsByiCqUKistfH6cnuLBo71BBothc87Ic2mWqZL--NWR8d_z2iTFb50evf1CoC2yZNNtsuJJnfp9h9xd0LkdNACsDMWDz14opKkUZo-emSdipbRpfcCgD5PsiSLHhKIDbXQTikNNHmf5g1IkSbuVXHaC-REKwUTUskDEkaliSsgYV9IZqSuaxZZzGVWqQmsXSsUgYdBYJUtbZ9YxE9UMF0rpCli7pJBOU7tHqDVWqchwBxcmXEVaE3Ps_hULy6Cu2SdFXJjxa94kY7xYk4M_7p-StU7S7417V4PrQ7KOe4U0jDA-IoXsbWaPAeszdeJ3-BMk2agq
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2024+46th+Annual+EOS%2FESD+Symposium+%28EOS%2FESD%29&rft.atitle=A+Physics-Based+Model+for+ESD+Protection+Devices+With+Open+Base+BJT+Configuration&rft.au=Mousavi%2C+Seyed+Mostafa&rft.au=Yan%2C+Xin&rft.au=Asadi%2C+Reza&rft.au=Mousavi%2C+Mehdi&rft.date=2024-09-16&rft.pub=EOS%2FESD+Association%2C+Inc&rft.volume=46&rft.spage=1&rft.epage=5&rft_id=info:doi/10.23919%2FEOS%2FESD61719.2024.10947612&rft.externalDocID=10947612