A Statistical Approach to Analyze the Impact of Random Discrete Dopant (RDD) and Oxide Thickness Variation (OTV) on the Performance of a Low Power Folded Cascode OTA - Dutta, Tanusree; Sarkhel, Saheli; Banerjee, Soham; Pandit, Soumya (Devices for Integrated Circuit, 2025)
Keywords: Gaussian distribution; Logic gates; Nanoscale devices; normal distribution; oxide thickness variation; Random discrete dopant; Thickness measurement; Threshold voltage; Transconductance; Very large scale integration; Voltage measurement; Weibull distribution