Parity based Error Correction Code for Embedded Memories

• Published in: Devices for Integrated Circuit pp. 160 - 165
• Main Authors: Srinidhi, K, Chakka, Surya. V. N. S. V., Vinodhini, M.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 05.04.2025
• Subjects: Circuit faults; Error Correction; Error correction codes; Error Detection; Integrated circuit modeling; Integrated circuit reliability; Memories; Power demand; Redundancy; Region Selection; Reliability; Scalability; Software; Software reliability; Transient analysis

Modern technology is rapidly evolving; modern circuits are becoming more optimized and complex, enabling higher processing speeds and increased storage capacities. However, as electronic devices shrink in size, they become more susceptible to faults, particularly in radiation-intensive environments...