Deterministic In-Fleet Scan Test for a Cloud Computing Platform

• Published in: Proceedings - International Test Conference pp. 391 - 399
• Main Authors: Trock, Dan, Mahadevan, Subramanian, Mukherjee, Nilanjan, Harrison, Lee, Rajski, Janusz, Tyszer, Jerzy
• Format: Conference Proceeding
• Language: English
• Published: IEEE 03.11.2024
• Subjects: Clocks; Cloud computing; Deterministic in-system tests; field errors; in-fleet scan test; Manufacturing; Monitoring; Optimization; silent data corruptions; Software; streaming scan network; System-on-chip; test power optimization; Testing; Transistors; Web services

Recently the semiconductor industry has been alerted by hyperscaler companies reporting impact of field errors in megascale datacenters. They tend to be elusive and very difficult to detect until they affect a particular application several days or months after the IC has been deployed in a fleet. A...