Deterministic In-Fleet Scan Test for a Cloud Computing Platform - Trock, Dan; Mahadevan, Subramanian; Mukherjee, Nilanjan; Harrison, Lee; Rajski, Janusz; Tyszer, Jerzy (Proceedings - International Test Conference, 2024)
Keywords: Clocks; Cloud computing; Deterministic in-system tests; field errors; in-fleet scan test; Manufacturing; Monitoring; Optimization; silent data corruptions; Software; streaming scan network; System-on-chip; test power optimization; Testing; Transistors; Web services