Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant - Li, Shu-Wen; Yen, Chia-Heng; Chang, Shuo-Wen; Chu, Ying-Hua; Wu, Kai-Chiang; Chao, Mango Chia-Tso (Proceedings - International Test Conference, 2024)
Keywords: Authorization; defective parts per million (dppm); geographical part average testing (gpat); good-die-in-bad-neighborhood (gdbn); IEEE merchandise; latent defect; neural network; Neural networks; Noise reduction; Semiconductor device modeling; Training