APA (7th ed.) Citation

Li, S., Yen, C., Chang, S., Chu, Y., Wu, K., & Chao, M. C. (2024, November 3). Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant. Proceedings - International Test Conference, 76-80. https://doi.org/10.1109/ITC51657.2024.00023

Chicago Style (17th ed.) Citation

Li, Shu-Wen, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, and Mango Chia-Tso Chao. "Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant." Proceedings - International Test Conference 3 Nov. 2024: 76-80. https://doi.org/10.1109/ITC51657.2024.00023.

MLA (9th ed.) Citation

Li, Shu-Wen, et al. "Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant." Proceedings - International Test Conference, 3 Nov. 2024, pp. 76-80, https://doi.org/10.1109/ITC51657.2024.00023.