qFD: Coherent and Depolarizing Fault Diagnosis for Quantum Processors

• Published in: Proceedings - International Test Conference pp. 187 - 196
• Main Authors: Li, Yen-Wei, Hsieh, Cheng-Yun, Wu, Meng-Chen, Li, James Chien-Mo
• Format: Conference Proceeding
• Language: English
• Published: IEEE 03.11.2024
• Subjects: Accuracy; Circuit faults; Fault diagnosis; Logic gates; Noise measurement; noisy intermediate-scale quantum; Program processors; Quality function deployment; Quantum circuit; quantum processor; Size measurement; Tomography

Errors caused by faults would strongly affect the correctness of noisy intermediate-scale quantum (NISQ) circuits. In this work, we propose a technique for diagnosing coherent and incoherent faults for NISQ circuits. The proposed technique contains three phases: rough diagnosis, fine diagnosis, and...