qFD: Coherent and Depolarizing Fault Diagnosis for Quantum Processors - Li, Yen-Wei; Hsieh, Cheng-Yun; Wu, Meng-Chen; Li, James Chien-Mo (Proceedings - International Test Conference, 2024)
Keywords: Accuracy; Circuit faults; Fault diagnosis; Logic gates; Noise measurement; noisy intermediate-scale quantum; Program processors; Quality function deployment; Quantum circuit; quantum processor; Size measurement; Tomography