Predictive Testing for Aging in SRAMs and Mitigation - Lin, Yunkun; Li, Mingye; Gupta, Sandeep (Proceedings - International Test Conference, 2024)
Keywords: Aging; BTI; Design methodology; DVFS; energy; over-testing; Predictive tests; Prevention and mitigation; process variation; spatial correlation; SRAMs; Testing; under-testing; Voltage