Predictive Testing for Aging in SRAMs and Mitigation

We develop a method to estimate lifetime performance, yield, and power for Static Random-Access Memories (SRAMs) that captures the combination of process variations and aging. Using this method, we design and validate predictive tests to detect future aging failures. We use the results of predictive...

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Bibliographic Details
Published inProceedings - International Test Conference pp. 293 - 302
Main Authors Lin, Yunkun, Li, Mingye, Gupta, Sandeep
Format Conference Proceeding
LanguageEnglish
Published IEEE 03.11.2024
Subjects
Aging
BTI
Design methodology
DVFS
energy
over-testing
Predictive tests
Prevention and mitigation
process variation
spatial correlation
SRAMs
Testing
under-testing
Voltage
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Summary:We develop a method to estimate lifetime performance, yield, and power for Static Random-Access Memories (SRAMs) that captures the combination of process variations and aging. Using this method, we design and validate predictive tests to detect future aging failures. We use the results of predictive tests to reconfigure dynamic voltage and frequency scaling (DVFS) to reduce aging failures at minimal energy and latency overheads.
ISSN:2378-2250
DOI:10.1109/ITC51657.2024.00050