Local laser irradiation technique for SEE testing of ICs

• Published in: 2011 12th European Conference on Radiation and Its Effects on Components and Systems pp. 449 - 453
• Main Authors: Chumakov, A. I., Pechenkin, A. A., Savchenkov, D. V., Tararaksin, A. S., Vasil'ev, A. L., Yanenko, A. V.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.09.2011
• Subjects: Laser modes; Measurement by laser beam; Radiation effects; Semiconductor lasers; Very large scale integration

The results of local laser simulation for estimation of SEE parameters are presented. Simulation method is based on the local laser irradiation of VLSI by measuring response in power supply circuits and determining laser threshold energy of SEE.