Zhang, H., Tian, G., He, Y., & Zuo, X. (2011, September). Defect depth effects in Pulsed Eddy Current thermography. 2011 17th International Conference on Automation and Computin, 251-254.
Chicago Style (17th ed.) CitationZhang, Hong, Guiyun Tian, Yunze He, and Xianzhang Zuo. "Defect Depth Effects in Pulsed Eddy Current Thermography." 2011 17th International Conference on Automation and Computin Sep. 2011: 251-254.
MLA (9th ed.) CitationZhang, Hong, et al. "Defect Depth Effects in Pulsed Eddy Current Thermography." 2011 17th International Conference on Automation and Computin, Sep. 2011, pp. 251-254.
Warning: These citations may not always be 100% accurate.