Knowledge-based neural network (KBNN) modeling of HBT junction temperature and thermal resistance from electrical measurements

• Published in: 2017 IEEE MTT-S International Microwave Symposium (IMS) pp. 1069 - 1071
• Main Authors: Iwamoto, Masaya, Jianjun Xu, Wenfan Zhou, Root, David E.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.06.2017
• Subjects: Artificial neural networks (ANNs); device modeling; Electrical resistance measurement; Heterojunction bipolar transistors; heterojunction bipolar transistors (HBTs); Junctions; Temperature distribution; Temperature measurement; thermal modeling; Thermal resistance

A knowledge-based neural network (KBNN) modeling and analysis method is presented for determining junction temperature, Tj, and thermal resistance, Rth, from simple electrical measurements of HBTs. The method retains sound physical principles of classical approaches but provides significant addition...