Knowledge-based neural network (KBNN) modeling of HBT junction temperature and thermal resistance from electrical measurements - Iwamoto, Masaya; Jianjun Xu; Wenfan Zhou; Root, David E. (2017 IEEE MTT-S International Microwave Symposium (IMS), 2017)
Keywords: Artificial neural networks (ANNs); device modeling; Electrical resistance measurement; Heterojunction bipolar transistors; heterojunction bipolar transistors (HBTs); Junctions; Temperature distribution; Temperature measurement; thermal modeling; Thermal resistance