Mold compound selection study for CMOS90 176 lead LQFP 24×24mm package

Semiconductor chip packages is getting more challenging nowadays with increase of I/O and lead counts, especially for thin and large body packages such as LQFP (Low Profile Quad Flat Packages) and TQFP (Thin Quad Flat Packages). Material selection for such package especially for automotive product i...

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Bibliographic Details
Published in2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) pp. 1 - 5
Main Authors Teng Seng Kiong, Ruzaini, I., Hian, S. T. S.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2012
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Summary:Semiconductor chip packages is getting more challenging nowadays with increase of I/O and lead counts, especially for thin and large body packages such as LQFP (Low Profile Quad Flat Packages) and TQFP (Thin Quad Flat Packages). Material selection for such package especially for automotive product is a key for qualification success and long term package reliability to meet industry requirement. This paper presents mold compound selection and development works done with several mold compound candidates from different mold compound suppliers, which include screening of candidates based on assembly output response, package reliability stress study as well as molding parameters optimization and establishment for selected mold compound for CMOS90 176 lead LQFP 24×24mm package. Mold compound properties of each compound candidate were studied.
ISBN:9781467343848
1467343846
ISSN:1089-8190
2576-9626
DOI:10.1109/IEMT.2012.6521769