In situ non contact temperature measurements on PCB during soldering process

The paper deals with investigation of non-contact electronic components' temperature measurements during soldering of surface mounted devices (SMD) to printed circuit boards (PCB). Approach and equipment for non contact temperature measurements with infrared (IR) thermometer is proposed. Measur...

Full description

Saved in:
Bibliographic Details
Published in2008 31st International Spring Seminar on Electronics Technology pp. 134 - 138
Main Authors Mashkov, P., Pencheva, T., Valchev, A., Gyoch, B.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2008
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The paper deals with investigation of non-contact electronic components' temperature measurements during soldering of surface mounted devices (SMD) to printed circuit boards (PCB). Approach and equipment for non contact temperature measurements with infrared (IR) thermometer is proposed. Measurements of electronic components' temperature on the PCB are difficult and practically impossible for a lot of electronic components during soldering process. In this paper the results concerning possibility for IR temperature measurements' application for in situ control of soldering processes are presented. Soldering equipment is based on low inert heaters for the middle IR spectral region without conveyor belt and allows realizing precise measurement and control (in situ) of the temperature on the PCB during the soldering processes, possibility of individual temperature profile for every printed board in dependence of its size, electronic components density and others. Contact temperature measurements (by thermocouples) in a few point on PCB allows controlling the soldering process, but the temperature is measured mostly in one or two points. Application of proposed method and equipment allows to optimize temperature regimes' control during soldering cycles and to avoid thermal damages of electronic components.
AbstractList The paper deals with investigation of non-contact electronic components' temperature measurements during soldering of surface mounted devices (SMD) to printed circuit boards (PCB). Approach and equipment for non contact temperature measurements with infrared (IR) thermometer is proposed. Measurements of electronic components' temperature on the PCB are difficult and practically impossible for a lot of electronic components during soldering process. In this paper the results concerning possibility for IR temperature measurements' application for in situ control of soldering processes are presented. Soldering equipment is based on low inert heaters for the middle IR spectral region without conveyor belt and allows realizing precise measurement and control (in situ) of the temperature on the PCB during the soldering processes, possibility of individual temperature profile for every printed board in dependence of its size, electronic components density and others. Contact temperature measurements (by thermocouples) in a few point on PCB allows controlling the soldering process, but the temperature is measured mostly in one or two points. Application of proposed method and equipment allows to optimize temperature regimes' control during soldering cycles and to avoid thermal damages of electronic components.
Author Gyoch, B.
Pencheva, T.
Mashkov, P.
Valchev, A.
Author_xml – sequence: 1
  givenname: P.
  surname: Mashkov
  fullname: Mashkov, P.
  organization: Phys. Dept., Univ. of Rousse, Rousse, Bulgaria
– sequence: 2
  givenname: T.
  surname: Pencheva
  fullname: Pencheva, T.
  organization: Phys. Dept., Univ. of Rousse, Rousse, Bulgaria
– sequence: 3
  givenname: A.
  surname: Valchev
  fullname: Valchev, A.
  organization: Phys. Dept., Univ. of Rousse, Rousse, Bulgaria
– sequence: 4
  givenname: B.
  surname: Gyoch
  fullname: Gyoch, B.
  organization: Phys. Dept., Univ. of Rousse, Rousse, Bulgaria
BookMark eNo1kFFLwzAUhSNOcJ37AeJL_kBrcpO06aOWqYWCwvY-0vROKmtamvTBf2_QCQe-c-By7-UkZOVGh4Tcc5ZxzsrHer_fZcCYzhQUueT6imzLQnMJUoqykPKaJP8B9Iqsgec8BQX6liTefzGmhAC-Jk3tqO_DQuMBakcXjA004DDhbMIyIx3Q-MgBXfA0znxUz7Rb5t59Uj-eO_x10zxa9P6O3JzM2eP2wg05vOwO1VvavL_W1VOT9iULqZYqPm0lQCHAasjxpEEUpWWiNdYqZZnk2HZ5zLpjheCllG2HXCrsRNSGPPyt7RHxOM39YObv46UI8QM0wVF8
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ISSE.2008.5276418
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE/IET Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9781424439744
1424439744
EndPage 138
ExternalDocumentID 5276418
Genre orig-research
GroupedDBID 29J
6IE
6IL
ACGFS
ALMA_UNASSIGNED_HOLDINGS
CBEJK
JC5
M43
RIE
RIL
ID FETCH-LOGICAL-i90t-845527c422732c826ef82379c03bacc55c041ebd603b8d0731944bde145ed3ed3
IEDL.DBID RIE
ISBN 1424439728
1424439736
9781424439720
9781424439737
ISSN 2161-2528
IngestDate Wed Jun 26 19:21:40 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-845527c422732c826ef82379c03bacc55c041ebd603b8d0731944bde145ed3ed3
PageCount 5
ParticipantIDs ieee_primary_5276418
PublicationCentury 2000
PublicationDate 2008-May
PublicationDateYYYYMMDD 2008-05-01
PublicationDate_xml – month: 05
  year: 2008
  text: 2008-May
PublicationDecade 2000
PublicationTitle 2008 31st International Spring Seminar on Electronics Technology
PublicationTitleAbbrev ISSE
PublicationYear 2008
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0053321
ssj0000453926
Score 1.4316669
Snippet The paper deals with investigation of non-contact electronic components' temperature measurements during soldering of surface mounted devices (SMD) to printed...
SourceID ieee
SourceType Publisher
StartPage 134
SubjectTerms Belts
Density measurement
Electronic components
Printed circuits
Process control
Size measurement
Soldering equipment
Temperature control
Temperature dependence
Temperature measurement
Title In situ non contact temperature measurements on PCB during soldering process
URI https://ieeexplore.ieee.org/document/5276418
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1JawIxFH6op_bSRUt3cuixo7O8jJNrRdFSi6AFbzJZBqRUpc5c-uv7MovW0kNhDvOSYUhCyFu_LwAPsc0Leoo81cSNHUwCdKTBwAkTDKgv7oqcbX_8Gg7f8HnO5zV43GFhjDF58Zlp29c8l6_XKrOhsg73uyF6UR3qkesXWK1dPIVME1L1YXUKkxWTY658smgcn_tRBeoi_XsgBGFF_FR2uody0C1zoZ4rOqPptF_UX5ZDObiTJVdJgxMYV5MpKlHe21kq2-rrF8_jf2d7Cq09-I9NdmrtDGpmdQ7HP3gLm_AyWrHtMs3Yar1ittg9VimzJFclQzP72Ecet4y-mfSeWAGIZLTXdf4btikwCi2YDfqz3tApr2VwlsJNnQgtaZtCnwwfX5F3YhJLeCOUG8hYKc6Vi56ROiQ50nSCeAJRauMhNzqg5wIaNDpzCczidjkqI0KpUHtCxAmqONIy4tavM1fQtMuy2BTEG4tyRa7_br6Bo6KYw1Yj3kIj_czMHVkMqbzPt8o31SGzkw
link.rule.ids 310,311,786,790,795,796,802,27956,55107
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LT8IwGP-CeFAvPsD4tgePDvZot_UqwYACIQETbmR9LCHGQWS7-Nf7dQ8Q48Fkh33tsrRN0-_5-xXgITJ5QUeipxrbkUVjj1pCU8_yY-phXxTwnG1_OPJ7b_RlxmY1eNxgYbTWefGZbpnXPJevljIzobI2cwOfOuEe7KOet4MCrbWJqKBxgsrer85htGNy1JWLNo3lMjesYF2ogXcEz6-on8pOe1f2gjIb6ti83Z9MukUFZjmYnVtZcqX0fAzDajpFLcp7K0tFS379Ynr873xPoLmF_5HxRrGdQk0nZ3D0g7mwAYN-QtaLNCPJMiGm3D2SKTE0VyVHM_nYxh7XBL8Zd55IAYkkuNtV_huyKlAKTZg-d6ednlVezGAtuJ1aITW0bZK6aPq4Ev0THRvKGy5tT0RSMiZt6mihfJRDhWeIwykVSjuUaeXhcw51HJ2-AGKQu4xKzX0hqXI4j2Iqo1CJkBnPTl9CwyzLfFVQb8zLFbn6u_keDnrT4WA-6I9er-GwKO0wtYk3UE8_M32L9kMq7vJt8w2HlLbn
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2008+31st+International+Spring+Seminar+on+Electronics+Technology&rft.atitle=In+situ+non+contact+temperature+measurements+on+PCB+during+soldering+process&rft.au=Mashkov%2C+P.&rft.au=Pencheva%2C+T.&rft.au=Valchev%2C+A.&rft.au=Gyoch%2C+B.&rft.date=2008-05-01&rft.pub=IEEE&rft.isbn=9781424439720&rft.issn=2161-2528&rft.spage=134&rft.epage=138&rft_id=info:doi/10.1109%2FISSE.2008.5276418&rft.externalDocID=5276418
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2161-2528&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2161-2528&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2161-2528&client=summon