Statistical analysis for the oscillation frequency of a ring oscillator

It is important to find the statistical characteristics of the ring oscillators in mass production but the computational complexity prevents us from finding the distribution of these characteristics. Consequently, predicting the statistical parameters of these characteristics is much more practical....

Full description

Saved in:
Bibliographic Details
Published in2010 IEEE International Conference of Electron Devices and Solid-State Circuits pp. 1 - 4
Main Authors Wanjing Zhu, Tan Lu, Weijie Zhu, Jianguo Ma
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.12.2010
Subjects
Online AccessGet full text

Cover

Loading…
Abstract It is important to find the statistical characteristics of the ring oscillators in mass production but the computational complexity prevents us from finding the distribution of these characteristics. Consequently, predicting the statistical parameters of these characteristics is much more practical. This paper derives the mathematical relationship between the variation of the capacitances and the process variations. And the Monte Carlo Method is used to build three linear prediction equations for the variation of oscillation frequency.
AbstractList It is important to find the statistical characteristics of the ring oscillators in mass production but the computational complexity prevents us from finding the distribution of these characteristics. Consequently, predicting the statistical parameters of these characteristics is much more practical. This paper derives the mathematical relationship between the variation of the capacitances and the process variations. And the Monte Carlo Method is used to build three linear prediction equations for the variation of oscillation frequency.
Author Tan Lu
Weijie Zhu
Wanjing Zhu
Jianguo Ma
Author_xml – sequence: 1
  surname: Wanjing Zhu
  fullname: Wanjing Zhu
  email: wanjing.zhu@yahoo.com
  organization: Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
– sequence: 2
  surname: Tan Lu
  fullname: Tan Lu
  organization: Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
– sequence: 3
  surname: Weijie Zhu
  fullname: Weijie Zhu
  organization: Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
– sequence: 4
  surname: Jianguo Ma
  fullname: Jianguo Ma
  email: majg@tju.edu.cn
  organization: Sch. of Electron. & Inf. Eng., Tianjin Univ., Tianjin, China
BookMark eNo9j0tOwzAYhI0ACVpyAdj4Amnt-BUvUWgLUqUu0n3lOL_BKNhgh0VuTyQKsxl9mtFIs0BXIQZA6J6SFaVErzdPbdusKjKzUJTJml-gBeUV51rrml-iQqv6j5W6QUXO72SWqFTN9S3ataMZfR69NQM2wQxT9hm7mPD4Bjhm64dhLsSAXYKvbwh2wtFhg5MPr_95THfo2pkhQ3H2JTpuN8fmudwfdi_N4770moylYrUwqmNW9kJYxWXPCDWgOtsL3utOSpCc2opKKp1k0tFeM-M0cKCuAsKW6OF31gPA6TP5D5Om0_k6-wGg5E95
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/EDSSC.2010.5713684
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 1424499984
9781424499960
1424499968
9781424499984
EndPage 4
ExternalDocumentID 5713684
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
AAWTH
ADFMO
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-LOGICAL-i90t-7385a7b3c6d55c746d301ae7bcd54d9b66e641c21616f636f1d93af9e4e1f2e03
IEDL.DBID RIE
ISBN 9781424499977
1424499976
IngestDate Wed Aug 27 03:35:12 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-7385a7b3c6d55c746d301ae7bcd54d9b66e641c21616f636f1d93af9e4e1f2e03
PageCount 4
ParticipantIDs ieee_primary_5713684
PublicationCentury 2000
PublicationDate 2010-Dec.
PublicationDateYYYYMMDD 2010-12-01
PublicationDate_xml – month: 12
  year: 2010
  text: 2010-Dec.
PublicationDecade 2010
PublicationTitle 2010 IEEE International Conference of Electron Devices and Solid-State Circuits
PublicationTitleAbbrev EDSSC
PublicationYear 2010
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000527849
Score 1.4502814
Snippet It is important to find the statistical characteristics of the ring oscillators in mass production but the computational complexity prevents us from finding...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Capacitance
Logic gates
Monte-Carlo Method
Process Variation
Ring Oscillator
Statistical Analysis
Title Statistical analysis for the oscillation frequency of a ring oscillator
URI https://ieeexplore.ieee.org/document/5713684
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LSgMxFA1tV65UWvFNFi6dOjN5Tda1tQgVoRW6K3ncgFg6UmYW-vUm8xLFhZthHjAkEzL35OaccxG6sSYzoIiKBBEQUW1UpEgoGaa0si72f4fKrmnxxOcv9HHN1j1022lhAKAin8E4nFZ7-TY3ZUiV-cV7QnhG-6jvF261VqvLp8QsbKHJVrvlcY_graVTcy1a0Uws76b3y-WkZnY1b_1RXqWKLrNDtGjbVZNK3sZlocfm85dl438bfoRG3zo-_NxFqGPUg90QPQR8Wdkzqy1WjScJ9tgVeyyIg7fltubHYbevedYfOHdY4ZAB7J7n-xFazaaryTxqyilErzIuomBbo4QmhlvGjKDc-rmtQGhjGbVScw6cJib1EJA7TrhLrCTKSaCQuBRicoIGu3wHpwhTp1OeGZXG0lBp_FGD5lYCYx6wQ3aGhuEbbN5rw4xN0_3zv29foIO044hcokGxL-HKR_pCX1dD_AWPmaZ6
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwzV3JTsMwELVKOcAJUIvY8QGOKWniOPGBUxdaugipReot8jKREFWDSipUfoVf4eOwsyEQ10pcIseRLHlsxW_Gb94gdKVkIIG73PJdHywiJLe4a0qGccFVZOu_QyrXNBrT3iO5n3mzCvooc2EAICWfQcM007t8FcuVCZVp573p0oDkFMoBrN-0g_Z622_r1bx2nG5n2upZeQ0B64nZiWW0WrgvXEmV50mfUKU3NAdfSOURxQSlQElTOhr30Ii6NGoq5vKIAYFm5IDt6mG30LaGGZ6TJYeVARzbM3d2rEgW00DLp4WGVP7uF1k6NrvptCeTVkYly6fxo55Lepx199BnYYiMxfLcWCWiId9_aUT-U0vto_p3niJ-KE_gA1SBRQ3dGfycyk_zOea55grW2BxrrIuNduc84__haJnxyNc4jjDHJsJZfo-XdTTdxAQOUXURL-AIYRIJhwaSOzaThEn9FCCoYuB52iGB4BjVjMnDl0wQJMytffJ39yXa6U1Hw3DYHw9O0a5T8mHOUDVZruBco5pEXKS7C6Nww2v0BXaLAz8
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2010+IEEE+International+Conference+of+Electron+Devices+and+Solid-State+Circuits&rft.atitle=Statistical+analysis+for+the+oscillation+frequency+of+a+ring+oscillator&rft.au=Wanjing+Zhu&rft.au=Tan+Lu&rft.au=Weijie+Zhu&rft.au=Jianguo+Ma&rft.date=2010-12-01&rft.pub=IEEE&rft.isbn=9781424499977&rft.spage=1&rft.epage=4&rft_id=info:doi/10.1109%2FEDSSC.2010.5713684&rft.externalDocID=5713684
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424499977/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424499977/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424499977/sc.gif&client=summon&freeimage=true