A test solution for oxide thickness variations in the ATMEL TSTAC™ eFlash technology - Mauroux, P.-D; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Godard, B.; Festes, G.; Vachez, L. (2011 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2011)
Keywords: Arrays; characterization and test; Electric fields; embedded Flash; NAND array; Nonvolatile memory; oxide thickness; Programming; Reliability; retention; SPICE; Transistors