An All-Digital True-Random-Number Generator with Integrated De-correlation and Bias Correction at 3.2-to-86 MB/S, 2.58 PJ/Bit in 65-NM CMOS - Pamula, V. Rajesh; Xun Sun; Sung Kim; Ur Rahman, Fahim; Baosen Zhang; Sathe, Visvesh S. (2018 IEEE Symposium on VLSI Circuits, 2018)
Keywords: Bit rate; Correlation; Entropy; Markov processes; NIST; Radio frequency; Very large scale integration