Accurate measurement of small delay defect coverage of test patterns

• Published in: 2009 International Test Conference pp. 1 - 10
• Main Authors: Devta-Prasanna, N., Goel, S.K., Gunda, A., Ward, M., Krishnamurthy, P.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.11.2009
• Subjects: Automatic test pattern generation; Circuit faults; Circuit testing; Clocks; Fault detection; Frequency; Hazards; Integrated circuit measurements; Large scale integration; Propagation delay

Small delay defect (SDD) testing is expected to become more prevalent as technology nodes continue to shrink and design frequencies continue to increase. In this paper, we critically examine previously published methods for evaluating SDD coverage and identify their shortcomings as an accurate and p...