Accurate measurement of small delay defect coverage of test patterns

• Published in: 2009 International Test Conference pp. 1 - 10
• Main Authors: Devta-Prasanna, N., Goel, S.K., Gunda, A., Ward, M., Krishnamurthy, P.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.11.2009
• Subjects: Automatic test pattern generation; Circuit faults; Circuit testing; Clocks; Fault detection; Frequency; Hazards; Integrated circuit measurements; Large scale integration; Propagation delay
• ISBN: 1424448689; 9781424448685
• ISSN: 1089-3539; 2378-2250
• DOI: 10.1109/TEST.2009.5355644

Small delay defect (SDD) testing is expected to become more prevalent as technology nodes continue to shrink and design frequencies continue to increase. In this paper, we critically examine previously published methods for evaluating SDD coverage and identify their shortcomings as an accurate and practical coverage metric. We propose an accurate method for measuring the coverage of small delay defects by any given pattern set. We demonstrate that the proposed metric overcomes the identified shortcomings of previously published approaches. For several ISCAS and industrial circuits, we generate test patterns and compare their SDD coverage values using different methods. Experimental results also demonstrate that the proposed method is several times faster to compute. Finally, we evaluate different testing strategies for screening small delay defects.