Remarks on the Subject of Back-Up Protection of Residual Current Devices

Residual current devices without integral overcurrent protection (RCCBs) are back-up protected by fuses or miniature circuit-breakers (MCBs). If the latter are used, special attention must be given to the coordination between an RCCB and an MCB. This paper indicates probable cases of the aforementio...

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Published inThe International Conference on Information and Digital Technologies (Online) pp. 75 - 79
Main Authors Czapp, Stanislaw, Kowalak, Daniel
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2019
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ISSN2575-677X
DOI10.1109/DT.2019.8813461

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Abstract Residual current devices without integral overcurrent protection (RCCBs) are back-up protected by fuses or miniature circuit-breakers (MCBs). If the latter are used, special attention must be given to the coordination between an RCCB and an MCB. This paper indicates probable cases of the aforementioned devices coordination, in which back-up protection of the RCCB is not adequate. A laboratory test has shown that depending on the used type of the MCB, in case of value of short-circuit current close to the making and breaking capacity of an RCCB, excessive arc stress of the RCCB may occur. In case of short-circuit current of value close to the rated conditional short-circuit current of the RCCB, permissible values of peak current and Joule integral for the RCCB may be exceeded. All these stresses may limit electrical endurance of RCCBs.
AbstractList Residual current devices without integral overcurrent protection (RCCBs) are back-up protected by fuses or miniature circuit-breakers (MCBs). If the latter are used, special attention must be given to the coordination between an RCCB and an MCB. This paper indicates probable cases of the aforementioned devices coordination, in which back-up protection of the RCCB is not adequate. A laboratory test has shown that depending on the used type of the MCB, in case of value of short-circuit current close to the making and breaking capacity of an RCCB, excessive arc stress of the RCCB may occur. In case of short-circuit current of value close to the rated conditional short-circuit current of the RCCB, permissible values of peak current and Joule integral for the RCCB may be exceeded. All these stresses may limit electrical endurance of RCCBs.
Author Kowalak, Daniel
Czapp, Stanislaw
Author_xml – sequence: 1
  givenname: Stanislaw
  surname: Czapp
  fullname: Czapp, Stanislaw
  email: stanislaw.czapp@pg.edu.pl
  organization: Faculty of Electrical and Control Engineering, Gdansk University of Technology, Gdansk, Poland
– sequence: 2
  givenname: Daniel
  surname: Kowalak
  fullname: Kowalak, Daniel
  organization: Faculty of Electrical and Control Engineering, Gdansk University of Technology, Gdansk, Poland
BookMark eNotj01Lw0AURUdRsNasXbiZP5A4b5L5WmparVBQagR3ZTJ5g9PWpGQSwX9vwK4uHC6He6_JRdu1SMgtsAyAmftFlXEGJtMa8kLCGUmM0qC4Bigmfk5mXCiRSqU-r0gS444xxgUAcDEjqw1-234fadfS4Qvp-1jv0A208_TRun36caRvfTdMKEyNiW4whma0B1qOfY_tQBf4ExzGG3Lp7SFicso5qZ6WVblK16_PL-XDOg2GDWne5F4rZQtTe2SKg1S8cK7xCFJzaTSImrmCG-MZM0JpdNIIz7m3wF3D8jm5-9cGRNwe-zCt_92erud_sBlMyA
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/DT.2019.8813461
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9781728114019
1728114012
EISSN 2575-677X
EndPage 79
ExternalDocumentID 8813461
Genre orig-research
GroupedDBID 6IE
6IF
6IL
6IN
AAJGR
AAWTH
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
OCL
RIE
RIL
ID FETCH-LOGICAL-i90t-3d3f877a49bfe07216724ccdfe168269815b0c4299f009578ec695f22fa12cd03
IEDL.DBID RIE
IngestDate Wed Aug 27 07:43:11 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-3d3f877a49bfe07216724ccdfe168269815b0c4299f009578ec695f22fa12cd03
PageCount 5
ParticipantIDs ieee_primary_8813461
PublicationCentury 2000
PublicationDate 2019-June
PublicationDateYYYYMMDD 2019-06-01
PublicationDate_xml – month: 06
  year: 2019
  text: 2019-June
PublicationDecade 2010
PublicationTitle The International Conference on Information and Digital Technologies (Online)
PublicationTitleAbbrev DT
PublicationYear 2019
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0002511125
Score 1.69129
Snippet Residual current devices without integral overcurrent protection (RCCBs) are back-up protected by fuses or miniature circuit-breakers (MCBs). If the latter are...
SourceID ieee
SourceType Publisher
StartPage 75
SubjectTerms back-up protection
circuit-breaker
Electrodynamics
Fuses
Protection
RCCB
short-circuit
Short-circuit currents
Stress
Switches
Thermal stresses
Title Remarks on the Subject of Back-Up Protection of Residual Current Devices
URI https://ieeexplore.ieee.org/document/8813461
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFA5zJ734YxOdP8jBo9naJm3Tq84xBEXGBruNJH0BGbZj6y7-9ealdf7Ag7cSaFKS8L4vr9_7QsiNyFQUaSFYZlLDhIwTpjhELOE55KFyJMJ4le9zMp6Jx3k8b5HbXS0MAHjxGfTx0f_Lz0uzxVTZQMqQCzzr7LltVtdq7fIpSJUdWDfuPWGQDYZTVG7hVvBv_bg-xaPH6JA8fY5bi0aW_W2l--b9lyXjfz_siHS_6vToyw6BjkkLihNy8M1isEPGE3hT6-WGlgV1XI-6QIGZF1paeqfMks1W2EPlBVkFtk5g4-uzaOPcRIfgg0mXTEcP0_sxa25PYK9ZUDGecyvTVIlMW0ATtCSNhDG5hTBxR4pMhrEODKKRRZqVSjBJFtsosiqMTB7wU9IuygLOCOXIKRy0aytD7MKBWuLiQsq1lhKsOScdnJLFqvbHWDSz0fu7-YLs47LUcqtL0q7WW7hywF7pa7-iH2haoao
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELUqGICFjxbxjQdG3DaxkzgrlCpAW6EqlbpViXOWUEVStenCr8fnhPIhBrbIUhzLju49n989E3IjwsR1UyFYqALFhPR8lnBwmc8zyJzEkAhlVb4jP5qIp6k3bZDbTS0MAFjxGbTx0Z7lZ4VaY6qsI6XDBe51tg3uC6-q1tpkVJAsG7iu_Xucbtjpxajdwp_BvvfjAhWLH_19Mvz8ciUbmbfXZdpW779MGf87tAPS-qrUoy8bDDokDciPyN43k8EmicbwliznK1rk1LA9akIF5l5ooeldouZsssAeSivJyrF1DCtboUVr7ybaAxtOWiTuP8T3EavvT2CvYbdkPONaBkEiwlQD2qD5gSuUyjQ4vtlUhNLx0q5CPNJItAIJyg897bo6cVyVdfkx2cqLHE4I5cgqDLinWjrYhYE130SGgKeplKDVKWnilMwWlUPGrJ6Ns7-br8lOFA8Hs8Hj6Pmc7OISVeKrC7JVLtdwaWC-TK_s6n4AEg6k9w
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=The+International+Conference+on+Information+and+Digital+Technologies+%28Online%29&rft.atitle=Remarks+on+the+Subject+of+Back-Up+Protection+of+Residual+Current+Devices&rft.au=Czapp%2C+Stanislaw&rft.au=Kowalak%2C+Daniel&rft.date=2019-06-01&rft.pub=IEEE&rft.eissn=2575-677X&rft.spage=75&rft.epage=79&rft_id=info:doi/10.1109%2FDT.2019.8813461&rft.externalDocID=8813461