Fidelity and scaling of the PARSEC benchmark inputs
A good benchmark suite should provide users with inputs that have multiple levels of fidelity for different use cases such as running on real machines, register level simulations, or gate-level simulations. Although input reduction has been explored in the past, there is a lack of understanding how...
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Published in | 2010 IEEE International Symposium on Workload Characterization pp. 1 - 10 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.12.2010
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Subjects | |
Online Access | Get full text |
ISBN | 9781424492978 1424492971 |
DOI | 10.1109/IISWC.2010.5649519 |
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Abstract | A good benchmark suite should provide users with inputs that have multiple levels of fidelity for different use cases such as running on real machines, register level simulations, or gate-level simulations. Although input reduction has been explored in the past, there is a lack of understanding how to systematically scale input sets for a benchmark suite. This paper presents a framework that takes the novel view that benchmark inputs should be considered approximations of their original, full-sized inputs. It formulates the input selection problem for a benchmark as an optimization problem that maximizes the accuracy of the benchmark subject to a time constraint. The paper demonstrates how to use the proposed methodology to create several simulation input sets for the PARSEC benchmarks and how to quantify and measure their approximation error. The paper also shows which parts of the inputs are more likely to distort their original characteristics. Finally, the paper provides guidelines for users to create their own customized input sets. |
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AbstractList | A good benchmark suite should provide users with inputs that have multiple levels of fidelity for different use cases such as running on real machines, register level simulations, or gate-level simulations. Although input reduction has been explored in the past, there is a lack of understanding how to systematically scale input sets for a benchmark suite. This paper presents a framework that takes the novel view that benchmark inputs should be considered approximations of their original, full-sized inputs. It formulates the input selection problem for a benchmark as an optimization problem that maximizes the accuracy of the benchmark subject to a time constraint. The paper demonstrates how to use the proposed methodology to create several simulation input sets for the PARSEC benchmarks and how to quantify and measure their approximation error. The paper also shows which parts of the inputs are more likely to distort their original characteristics. Finally, the paper provides guidelines for users to create their own customized input sets. |
Author | Kai Li Bienia, C |
Author_xml | – sequence: 1 givenname: C surname: Bienia fullname: Bienia, C – sequence: 2 surname: Kai Li fullname: Kai Li |
BookMark | eNo1j9tKw0AYhFdU0Na8gN7sC6Tu6c9mL0toNVBQbMHLsoc_djVuSzde9O0NWOdm-BgYZibkKu0TEnLP2YxzZh7bdv3ezAQbGSplgJsLMuFKKGWEqeQlKYyu_1nXN6TI-ZONAqG1NrdELmPAPg4nalOg2ds-pg-67-iwQ_o6f1svGuow-d23PX7RmA4_Q74j153tMxZnn5LNcrFpnsvVy1PbzFdlNGwohQ3gOsEFiMoxwwOqUHtbgwEXPHg9pui5l0575kKHFUMtEaDDICU4OSUPf7UREbeHYxwnnLbnm_IXDKtH1w |
ContentType | Conference Proceeding |
DBID | 6IE 6IL CBEJK RIE RIL |
DOI | 10.1109/IISWC.2010.5649519 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP All) 1998-Present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
EISBN | 1424492963 9781424492961 |
EndPage | 10 |
ExternalDocumentID | 5649519 |
Genre | orig-research |
GroupedDBID | 6IE 6IF 6IK 6IL 6IN AAJGR AAWTH ADFMO ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK IEGSK IERZE OCL RIE RIL |
ID | FETCH-LOGICAL-i90t-2ad5bf212526b091de4d8ca8595bdc5c75bfec1c3b7c0bdfe60e73e55fed335b3 |
IEDL.DBID | RIE |
ISBN | 9781424492978 1424492971 |
IngestDate | Wed Aug 27 02:51:59 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i90t-2ad5bf212526b091de4d8ca8595bdc5c75bfec1c3b7c0bdfe60e73e55fed335b3 |
PageCount | 10 |
ParticipantIDs | ieee_primary_5649519 |
PublicationCentury | 2000 |
PublicationDate | 2010-Dec. |
PublicationDateYYYYMMDD | 2010-12-01 |
PublicationDate_xml | – month: 12 year: 2010 text: 2010-Dec. |
PublicationDecade | 2010 |
PublicationTitle | 2010 IEEE International Symposium on Workload Characterization |
PublicationTitleAbbrev | IISWC |
PublicationYear | 2010 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0000527779 |
Score | 1.588405 |
Snippet | A good benchmark suite should provide users with inputs that have multiple levels of fidelity for different use cases such as running on real machines,... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1 |
SubjectTerms | Accuracy Approximation error Benchmark testing Computational modeling Parallel processing Pixel |
Title | Fidelity and scaling of the PARSEC benchmark inputs |
URI | https://ieeexplore.ieee.org/document/5649519 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NS8MwGA5zJ08qm_hNDh7t1jVN2h6lbGzCZLiJu418vMEx7MbWXvz1vv0UxYO3NKEhIYHnyZv3eULIvXYNU2Hu3MoYc3yJ21i6InS0sBYBl0NYhC6mz2L86j8t-bJFHhotDAAUyWfQy4vFXb7Z6iwPlfW5QDqfe3we4TYrtVpNPMXlXhAEUa3dQtQPBrWlU_Ud1qIZN-pPJvO3uMzsqnr98bxKgS6jEzKtx1UmlWx6Wap6-vOXZeN_B35Kut86PjprEOqMtCDpEDbKna2QfFOZGHrANcI2urUUqSCdPb7MhzFV-Ov7h9xv6DrZZemhSxaj4SIeO9XTCc46clPHk4Yri6jEPaGQERjwTahl7mWmjOY6wFbQA81UoF1lLAgXAgacWzCMccXOSTvZJnBBKJ7_sBM_UgqZk_W04lxzYYVQEPlWykvSyee72pXmGKtqqld_V1-TY6_JB7kh7XSfwS2ieqruiuX8Ah7mnSo |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NT8IwGG4IHvSkBozf9uDRQVnXbjsaAgEFQgQjN9LPSIiDwHbx1_vu02g8eOvarOmbNnmevXufpwjdK6KpDFLnVkqp4wk4xoLwwFHcWgBcZoIsdTGe8MGr97Rgixp6qLQwxpis-My00mb2L19vVJKmytqMA51PPT4PAPc9lqu1qowKYa7v-2Gp3gLc9zulqVPxHJSyGRK2h8PZWzev7Srm_XHBSoYv_WM0LleWl5WsW0ksW-rzl2njf5d-gprfSj48rTDqFNVM1EC0n3pbAf3GItJ4D7sEY3hjMZBBPH18mfW6WMKr7x9it8araJvE-yaa93vz7sApLk9wViGJHVdoJi3gEnO5BE6gjacDJVI3M6kVUz6MGtVRVPqKSG0NJ8anhjFrNKVM0jNUjzaROUcYvgBhEi-UEriTdZVkTDFuOZcm9KwQF6iRxrvc5vYYyyLUy7-779DhYD4eLUfDyfMVOnKr6pBrVI93ibkBjI_lbba1X5FmoHc |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2010+IEEE+International+Symposium+on+Workload+Characterization&rft.atitle=Fidelity+and+scaling+of+the+PARSEC+benchmark+inputs&rft.au=Bienia%2C+C&rft.au=Kai+Li&rft.date=2010-12-01&rft.pub=IEEE&rft.isbn=9781424492978&rft.spage=1&rft.epage=10&rft_id=info:doi/10.1109%2FIISWC.2010.5649519&rft.externalDocID=5649519 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424492978/lc.gif&client=summon&freeimage=true |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424492978/mc.gif&client=summon&freeimage=true |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424492978/sc.gif&client=summon&freeimage=true |