Fault diagnosis in analog circuits using multiclass Relevance Vector Machine

In this paper the capability of Relevance Vector Machines to perform multiclass classification has been illustrated. It has been demonstrated how faults in an analog circuit can be diagnosed by analyzing these faults as a multiclass machine learning problem. A simple first order Op-amp RC circuit va...

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Published in2011 International Conference on Emerging Trends in Electrical and Computer Technology pp. 641 - 643
Main Authors Jain, V, Pillai, G N, Gupta, I
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.03.2011
Subjects
Analog circuits
Bayesian methods
Circuit faults
Machine learning
Mathematical model
Support vector machine classification
Testing
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Abstract In this paper the capability of Relevance Vector Machines to perform multiclass classification has been illustrated. It has been demonstrated how faults in an analog circuit can be diagnosed by analyzing these faults as a multiclass machine learning problem. A simple first order Op-amp RC circuit validates our methodology which can be further applied to more complex analog circuits employing a larger number of electronic components.
AbstractList In this paper the capability of Relevance Vector Machines to perform multiclass classification has been illustrated. It has been demonstrated how faults in an analog circuit can be diagnosed by analyzing these faults as a multiclass machine learning problem. A simple first order Op-amp RC circuit validates our methodology which can be further applied to more complex analog circuits employing a larger number of electronic components.
Author Gupta, I
Pillai, G N
Jain, V
Author_xml – sequence: 1
  givenname: V
  surname: Jain
  fullname: Jain, V
  organization: Dept. of Electr. Eng., Indian Inst. of Technol. Roorkee, Roorkee, India
– sequence: 2
  givenname: G N
  surname: Pillai
  fullname: Pillai, G N
  organization: Dept. of Electr. Eng., Indian Inst. of Technol. Roorkee, Roorkee, India
– sequence: 3
  givenname: I
  surname: Gupta
  fullname: Gupta, I
  organization: Dept. of Electr. Eng., Indian Inst. of Technol. Roorkee, Roorkee, India
BookMark eNpFT8FKxDAUjKigu-4X6CE_0DVJk7Q5SumuCxVBitflNX2tkW4qTSv49wZc8M1hGGYY5q3IlR89EvLA2ZZzZh4PRVmXRb0VjPOtyjTjRl-QFZdCyswIrS__RcpvyCaETxZPayOMuSXVDpZhpq2D3o_BBeo8BQ_D2FPrJru4OdAlON_TU8w5O0AI9A0H_AZvkb6jnceJvoD9cB7vyHUHQ8DNmdek3pV18ZxUr_tD8VQlzrA5EVqlItegULYRXcpVakFZKQG0tk3X5DHS8IyJRuQKhBbRzVsbZyPvZLom93-1DhGPX5M7wfRzPD-f_gL49lCC
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICETECT.2011.5760196
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 1424479266
9781424479269
1424479258
9781424479252
EndPage 643
ExternalDocumentID 5760196
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
AAWTH
ADFMO
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-LOGICAL-i90t-2653286a5e4d4d4f3153ca5c44aa66cbfb8265b1702b285a262a5c8dc000e1f43
IEDL.DBID RIE
ISBN 1424479231
9781424479238
IngestDate Wed Aug 27 02:48:39 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-2653286a5e4d4d4f3153ca5c44aa66cbfb8265b1702b285a262a5c8dc000e1f43
PageCount 3
ParticipantIDs ieee_primary_5760196
PublicationCentury 2000
PublicationDate 2011-March
PublicationDateYYYYMMDD 2011-03-01
PublicationDate_xml – month: 03
  year: 2011
  text: 2011-March
PublicationDecade 2010
PublicationTitle 2011 International Conference on Emerging Trends in Electrical and Computer Technology
PublicationTitleAbbrev ICETECT
PublicationYear 2011
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000669299
Score 1.4697506
Snippet In this paper the capability of Relevance Vector Machines to perform multiclass classification has been illustrated. It has been demonstrated how faults in an...
SourceID ieee
SourceType Publisher
StartPage 641
SubjectTerms Analog circuits
Bayesian methods
Circuit faults
Machine learning
Mathematical model
Support vector machine classification
Testing
Title Fault diagnosis in analog circuits using multiclass Relevance Vector Machine
URI https://ieeexplore.ieee.org/document/5760196
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PT4MwGG22nTyp2Yy_04NHmVBoKWeyZRpnjEGz29KfhmiY2eDiX-_XwmY0HgwXKAlpvkIf39f3XhG6SkxktbVpYBmHBEVkWcBVKuC7EiLWVtqUO4Hz_IHNnpO7BV300PVOC2OM8eQzM3anfi1fr1TjSmWQvDNn59JHfUjcWq3Wrp4C0AlIn221W84WL9paOnXXvJPORWF2c5tPikletB6e3XN_bLDi8WW6j-bbnrW0krdxU8ux-vxl2vjfrh-g0beSDz_uMOoQ9Uw1RPdT0bzXWLcsu3KDywqLylVxsCrXqinrDXZ8-Ffs6YbK_WDjJydEd68IfvGFfjz3NEwzQsV0UuSzoNtVISizsA4IozHhTFCTaDhsDFOeElQliRCMKWklJBxURmlIJOFUEEbgLtcKQgzjmsRHaFCtKnOMcKK4FcRIKzjMA1pnJJVU6pC5pVCamhM0dIFYfrS-GcsuBqd_N5-hvbZe6_hd52hQrxtzAYBfy0s_0l-HOqf6
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PT4MwGP0y50FPajbjb3vwKBM6Wsp52bLpWIxBs9vSn4ZomNng4l9vC2xG48FwgZKQ5iv08X197xXgJtSBUcZEnqHMJig8jj0mI26_K877yggTMSdwTmZ0_Bzez8m8BbdbLYzWuiKf6Z47rdby1VKWrlRmk3fq7Fx2YNfiPglqtda2omLB02J9vFFvOWO8YGPq1FyzRjwX-PHdZDBMh4O0dvFsnvxji5UKYUYHkGz6VhNL3nplIXry85dt4387fwjdby0fetyi1BG0dN6B6YiX7wVSNc8uW6MsRzx3dRwks5Uss2KNHCP-FVWEQ-l-sdGTk6K7lwS9VKV-lFRETN2FdDRMB2Ov2VfBy2K_8DAlfcwoJzpU9jB9O-lJTmQYck6pFEbYlIOIIPKxwIxwTLG9y5S0IbYjG_aPoZ0vc30CKJTMcKyF4czOBErFOBJEKJ-6xVAS6VPouEAsPmrnjEUTg7O_m69hb5wm08V0Mns4h_26euvYXhfQLlalvrTwX4iratS_AICrq0M
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+International+Conference+on+Emerging+Trends+in+Electrical+and+Computer+Technology&rft.atitle=Fault+diagnosis+in+analog+circuits+using+multiclass+Relevance+Vector+Machine&rft.au=Jain%2C+V&rft.au=Pillai%2C+G+N&rft.au=Gupta%2C+I&rft.date=2011-03-01&rft.pub=IEEE&rft.isbn=9781424479238&rft.spage=641&rft.epage=643&rft_id=info:doi/10.1109%2FICETECT.2011.5760196&rft.externalDocID=5760196
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424479238/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424479238/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424479238/sc.gif&client=summon&freeimage=true