APA (7th ed.) Citation

Gao, Y., Guan, W., Muramatsu, K., Tian, C., Yuan, J., & Chen, B. (2016, November). Investigation on numerical modeling of excess loss in SiFe sheet considering pinning effect. 2016 IEEE Conference on Electromagnetic Field Computation (CEFC), 1. https://doi.org/10.1109/CEFC.2016.7815906

Chicago Style (17th ed.) Citation

Gao, Yanhui, Weimin Guan, Kazuhiro Muramatsu, Cuihua Tian, Jiaxin Yuan, and Baichao Chen. "Investigation on Numerical Modeling of Excess Loss in SiFe Sheet Considering Pinning Effect." 2016 IEEE Conference on Electromagnetic Field Computation (CEFC) Nov. 2016: 1. https://doi.org/10.1109/CEFC.2016.7815906.

MLA (9th ed.) Citation

Gao, Yanhui, et al. "Investigation on Numerical Modeling of Excess Loss in SiFe Sheet Considering Pinning Effect." 2016 IEEE Conference on Electromagnetic Field Computation (CEFC), Nov. 2016, p. 1, https://doi.org/10.1109/CEFC.2016.7815906.

Warning: These citations may not always be 100% accurate.