Gao, Y., Guan, W., Muramatsu, K., Tian, C., Yuan, J., & Chen, B. (2016, November). Investigation on numerical modeling of excess loss in SiFe sheet considering pinning effect. 2016 IEEE Conference on Electromagnetic Field Computation (CEFC), 1. https://doi.org/10.1109/CEFC.2016.7815906
Chicago Style (17th ed.) CitationGao, Yanhui, Weimin Guan, Kazuhiro Muramatsu, Cuihua Tian, Jiaxin Yuan, and Baichao Chen. "Investigation on Numerical Modeling of Excess Loss in SiFe Sheet Considering Pinning Effect." 2016 IEEE Conference on Electromagnetic Field Computation (CEFC) Nov. 2016: 1. https://doi.org/10.1109/CEFC.2016.7815906.
MLA (9th ed.) CitationGao, Yanhui, et al. "Investigation on Numerical Modeling of Excess Loss in SiFe Sheet Considering Pinning Effect." 2016 IEEE Conference on Electromagnetic Field Computation (CEFC), Nov. 2016, p. 1, https://doi.org/10.1109/CEFC.2016.7815906.