Multi-parameter high-resolution spatial maps of a CdZnTe radiation detector array

Resistivity results from a 48/spl times/48 pixelated CdZnTe (CZT) radiation detector array are presented alongside X-ray topography and detector mapping with a collimated gamma-ray beam. By using a variety of measurements performed on the same sample and registering each data set relative to the oth...

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Published in1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255) Vol. 1; pp. 646 - 651 vol.1
Main Authors Hilton, N.R., Barber, H.B., Brunett, B.A., Eskin, J.D., Goorsky, M.S., James, R.B., Lund, J.C., Marks, D.G., Schlesinger, T.E., Teska, T.M., Van Scyoc, J.M., Woolfenden, J.M., Yoon, H.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1998
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Summary:Resistivity results from a 48/spl times/48 pixelated CdZnTe (CZT) radiation detector array are presented alongside X-ray topography and detector mapping with a collimated gamma-ray beam. By using a variety of measurements performed on the same sample and registering each data set relative to the others, the spatial dependence of relationships between them was examined. The local correlations between resistivity and one measure of detector performance were strongly influenced by the positions of grain boundaries and other gross crystal defects in the sample. These measurements highlight the need for material studies of spatially heterogeneous CZT to record position information along with the parameters under study.
ISBN:0780350219
9780780350212
ISSN:1082-3654
2577-0829
DOI:10.1109/NSSMIC.1998.775222