Modeling the Performance of Gamma-ray Source Detection and Identification Algorithms using Spectral Distinctiveness and Similarity Metrics

• Published in: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) p. 1
• Main Authors: Bandstra, M. S., Archer, D. E., Daughhetee, J. D., Ghawaly, J. M., Jones, A. C., Joshi, T. H. Y., Nachtsheim, A., Nicholson, A. D., Peplow, D. E., Prins, N., Quiter, B. J.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 04.11.2023
• Subjects: Gamma-rays; Machine learning; Microwave integrated circuits; Radioactive materials; Semiconductor detectors; Semiconductor device measurement; Time series analysis

Over the last two decades, the widespread deployment of gamma-ray spectrometers for radiological and nuclear security applications has led to the need to develop sophisticated methods for detecting and identifying threat sources and other non-background anomalies. A major challenge has been to achie...