De-multiplexing for improved activity recovery and signal-to-noise for a brain-dedicated multi-pinhole SPECT system

• Published in: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) p. 1
• Main Authors: Pells, S., Zeraatkar, N., Kalluri, K. S., Moore, S. C., May, M., Furenlid, L. R., Kuo, P. H., King, M. A.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 04.11.2023
• Subjects: High-resolution imaging; Imaging phantoms; Microwave integrated circuits; Multiplexing; Noise measurement; Semiconductor detectors; Sensitivity

Pinhole collimation can provide high-resolution imaging but at the cost of a lower sensitivity compared to parallel-hole collimators. Simultaneous imaging through multiple pinholes increases sensitivity but can lead to multiplexing artefacts due to ambiguity in projection images. Here, the impact of...