Investigation of Single Event Effect Susceptibility of Inner Memory Blocks in 28 nm Xilinx SoC Using 239Pu

• Published in: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) pp. 1 - 4
• Main Authors: Yonghong, Li, Weitao, Yang, Chaohui, He, Yang, Li
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.05.2018
• Subjects: Alpha Particles; Single Event Functional Interrupt; Single Event Upset; System-on-Chip

Single event upset (SEU) susceptibility of memory blocks in 28nm Xilinx Zynq-7000 All Programmable SoC was investigated using an alpha radioactive source 239 Pu. The tested memory blocks included on chip memory (OCM), Register, D-Cache and BRAM. The upset addresses and bits were detected using our d...