An approach for failure prediction in H3 TRB-tests - Kolbinger, Elisabeth; Wuest, Felix; Dijk, Marius van; Trampert, Stefan; Lang, Klaus-Dieter (2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC), 2019)
Keywords: Absorption; Corrosion; diffusion processes; H3TRB-Test; High-voltage techniques; Humidity; Moisture; Multichip modules; power modules; Reliability