APA (7th ed.) Citation

Kolbinger, E., Wuest, F., Dijk, M. v., Trampert, S., & Lang, K. (2019, September). An approach for failure prediction in H3 TRB-tests. 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC), 1-5. https://doi.org/10.23919/EMPC44848.2019.8951836

Chicago Style (17th ed.) Citation

Kolbinger, Elisabeth, Felix Wuest, Marius van Dijk, Stefan Trampert, and Klaus-Dieter Lang. "An Approach for Failure Prediction in H3 TRB-tests." 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC) Sep. 2019: 1-5. https://doi.org/10.23919/EMPC44848.2019.8951836.

MLA (9th ed.) Citation

Kolbinger, Elisabeth, et al. "An Approach for Failure Prediction in H3 TRB-tests." 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC), Sep. 2019, pp. 1-5, https://doi.org/10.23919/EMPC44848.2019.8951836.