High Strain Rate Materials Characterization at Low Test Temperatures for Thermally Aged SAC-Q Solder Alloys
A number of doped SnAgCu alloys have emerged to mitigate the effects of thermal aging on the property deterioration of the interconnects. Much less is known about the performance of alloys at low temperatures simultaneously with high strain rates which may be encountered in harsh environment applica...
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Published in | 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) pp. 1 - 16 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
31.05.2022
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Abstract | A number of doped SnAgCu alloys have emerged to mitigate the effects of thermal aging on the property deterioration of the interconnects. Much less is known about the performance of alloys at low temperatures simultaneously with high strain rates which may be encountered in harsh environment applications including automotive, aerospace and defense. Electronics in harsh environments is often used for function critical use. High strain-rate and low temperatures may occur during storage, transport and operation. In this paper, data on the evolution of material properties including the elastic modulus, ultimate tensile strength is presented for SAC-Q solder which includes Bi in addition to SnAgCu. The high strain rate low temperature data has been fit to the Anand Viscoplasticity Model to represent the non-linear constitutive behavior. The evolution of the Anand Constants has been presented with the increase in storage duration for period of upto 1-year at a storage temperature of 50°C. The accuracy of Anand model has been quantified by comparing the experimentally measured data with the predicted data with the computed model constants. The Anand parameters have been implemented in an FE-framework to simulate the drop events for a ball-grid array package on printed circuit board assembly to determine hysteresis loop and plastic work density. Effect of the evolution of the properties on the change in the hysteresis loops has been assessed. |
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AbstractList | A number of doped SnAgCu alloys have emerged to mitigate the effects of thermal aging on the property deterioration of the interconnects. Much less is known about the performance of alloys at low temperatures simultaneously with high strain rates which may be encountered in harsh environment applications including automotive, aerospace and defense. Electronics in harsh environments is often used for function critical use. High strain-rate and low temperatures may occur during storage, transport and operation. In this paper, data on the evolution of material properties including the elastic modulus, ultimate tensile strength is presented for SAC-Q solder which includes Bi in addition to SnAgCu. The high strain rate low temperature data has been fit to the Anand Viscoplasticity Model to represent the non-linear constitutive behavior. The evolution of the Anand Constants has been presented with the increase in storage duration for period of upto 1-year at a storage temperature of 50°C. The accuracy of Anand model has been quantified by comparing the experimentally measured data with the predicted data with the computed model constants. The Anand parameters have been implemented in an FE-framework to simulate the drop events for a ball-grid array package on printed circuit board assembly to determine hysteresis loop and plastic work density. Effect of the evolution of the properties on the change in the hysteresis loops has been assessed. |
Author | Yadav, Vikas Suhling, Jeff Lall, Pradeep Locker, David |
Author_xml | – sequence: 1 givenname: Pradeep surname: Lall fullname: Lall, Pradeep email: lall@auburn.edu organization: Auburn University,NSF-CAVE3 Electronics Research Center,Department of Mechanical Engineering,Auburn,AL,36849 – sequence: 2 givenname: Vikas surname: Yadav fullname: Yadav, Vikas organization: Auburn University,NSF-CAVE3 Electronics Research Center,Department of Mechanical Engineering,Auburn,AL,36849 – sequence: 3 givenname: Jeff surname: Suhling fullname: Suhling, Jeff organization: Auburn University,NSF-CAVE3 Electronics Research Center,Department of Mechanical Engineering,Auburn,AL,36849 – sequence: 4 givenname: David surname: Locker fullname: Locker, David organization: US Army CCDC-AvMC,Huntsville,AL,35898 |
BookMark | eNotkN1Kw0AUhFdRsK0-gTfnBVLP_nb3MgS1QkW0uS_b5KRdTZOyiUh8eqP2ZoZhYPiYKbto2oYYA45zztHdhXxP8aAVWj0XKMTcWee01Gdsyo3RymqU-pxNhHEqEVzqKzbtundEObY4YR_LsNvDuo8-NPDme4LnUWLwdQfZ3kdf_KZv34e2Ad_Dqv2CnLp-lMORou8_I3VQtRH-QHxdD5DuqIR1miWvsG7rkiKkdd0O3TW7rMZdujn5jOUP93m2TFYvj09ZukqCsphY3KqF4N5shRWKuMFKIqmKbLEdsRe2LBbcKpTojNYlWqfIikpqVxXclErO2O3_bCCizTGGg4_D5vSL_AGYmlo8 |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/iTherm54085.2022.9899535 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library Online IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Xplore Digital Library url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISBN | 1665485035 9781665485036 |
EISSN | 2694-2135 |
EndPage | 16 |
ExternalDocumentID | 9899535 |
Genre | orig-research |
GroupedDBID | 29Q 6IE 6IF 6IH 6IK 6IL 6IM 6IN AAJGR ABLEC ACGFS ADZIZ ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO IEGSK IJVOP IPLJI M43 OCL RIE RIL RIO RNS |
ID | FETCH-LOGICAL-i480-80b4721a6b2824e160f30e4fe8cb00378dc71840309655d0894e82f359fc16d43 |
IEDL.DBID | RIE |
IngestDate | Wed Jun 26 19:25:46 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | true |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i480-80b4721a6b2824e160f30e4fe8cb00378dc71840309655d0894e82f359fc16d43 |
PageCount | 16 |
ParticipantIDs | ieee_primary_9899535 |
PublicationCentury | 2000 |
PublicationDate | 2022-May-31 |
PublicationDateYYYYMMDD | 2022-05-31 |
PublicationDate_xml | – month: 05 year: 2022 text: 2022-May-31 day: 31 |
PublicationDecade | 2020 |
PublicationTitle | 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) |
PublicationTitleAbbrev | iTherm |
PublicationYear | 2022 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0036650 |
Score | 2.236694 |
Snippet | A number of doped SnAgCu alloys have emerged to mitigate the effects of thermal aging on the property deterioration of the interconnects. Much less is known... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1 |
SubjectTerms | Aging Anand Viscoplastic model Computational modeling Data models High Strain Rate Low Temperature Metals Predictive models SAC-Q SAC105 Temperature measurement Thermomechanical processes |
Title | High Strain Rate Materials Characterization at Low Test Temperatures for Thermally Aged SAC-Q Solder Alloys |
URI | https://ieeexplore.ieee.org/document/9899535 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEN4AJ734AOM7e_BoS2l32-6REAkxYlQw4Ub2aQiVGigx-Oud7QI-4sFLs2m6aXemu_PN7sw3CF0ZmECGEuIlimuPwGMe5yTxEtAwZ0pKwe1-R_8-7j2T2xEdVdD1NhdGa10Gn2nfNsuzfJXLpd0qazJwDmhEq6iaMOZytTarbhQD1NhE6gSsOQEpz1-p5e8CJzAM_XXfH0VUShvS3UP9zdtd6MjUXxbClx-_iBn_-3n7qPGVrYcftnboAFX07BDtfiMarKOpDefAg7IeBH4CeIn7vHD_Hu5sKZtdRibmBb7L3_EQ7AVcAFY72uUFBnyLywHzLFvh9otWeNDueI94kNta37idZflq0UDD7s2w0_PWZRa8CUkDMFGCgBvIYwHeF9GtODBRoInRqbRTPkmVTKwbGFmeGKqClBGdhiaizMhWrEh0hGqzfKaPETagaxgsp1IQwsJUxIJzBSuCCoxRkpygupXa-M0RaYzXAjv9-_YZ2rGac0f156hWzJf6AhBAIS5L1X8CUH-yxw |
link.rule.ids | 310,311,783,787,792,793,799,23942,23943,25152,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEN4gHtSLDzC-3YNHC6Xd7eNIiASVEpWacCP7NIRKDZQY_PXOtoCPePDSNM027c7s7nyzO_MNQlcaJpCmhFi-ZMoi0MxijPiWDxpmoRSCM7PfEfW8zjO5G9BBCV2vc2GUUnnwmaqZ2_wsX6ZibrbK6iE4B9SlG2gTcHXgFdlaq3XX9QBsrGJ17LA-AjlPX6lh8AI30HFqy7d_lFHJrUh7F0Wr7xfBI-PaPOM18fGLmvG_P7iHql_5evhhbYn2UUlNDtDON6rBChqbgA7czytC4CcAmDhiWTH6cGtN2lzkZGKW4W76jmOwGHABYF0QL88wIFycd5glyQI3X5TE_WbLesT91FT7xs0kSRezKorbN3GrYy0LLVgjEthgpDgBR5B5HPwvohqerV1bEa0CYSa9H0jhG0fQNUwxVNpBSFTgaJeGWjQ8SdxDVJ6kE3WEsAZtQ2cZFZyQ0Am4xxmTsCZIW2spyDGqGKkN3woqjeFSYCd_P75EW5046g67t737U7RttFgc3J-hcjadq3PAAxm_yIfBJ9V8thI |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=2022+21st+IEEE+Intersociety+Conference+on+Thermal+and+Thermomechanical+Phenomena+in+Electronic+Systems+%28iTherm%29&rft.atitle=High+Strain+Rate+Materials+Characterization+at+Low+Test+Temperatures+for+Thermally+Aged+SAC-Q+Solder+Alloys&rft.au=Lall%2C+Pradeep&rft.au=Yadav%2C+Vikas&rft.au=Suhling%2C+Jeff&rft.au=Locker%2C+David&rft.date=2022-05-31&rft.pub=IEEE&rft.eissn=2694-2135&rft.spage=1&rft.epage=16&rft_id=info:doi/10.1109%2FiTherm54085.2022.9899535&rft.externalDocID=9899535 |