Discriminative Deep Metric Learning for Face Verification in the Wild

• Published in: 2014 IEEE Conference on Computer Vision and Pattern Recognition pp. 1875 - 1882
• Main Authors: Hu, Junlin, Lu, Jiwen, Tan, Yap-Peng
• Format: Conference Proceeding Journal Article
• Language: English
• Published: IEEE 01.06.2014
• Subjects: Computer vision; Conferences; Deep Learning; Face; Face Verification; Feature extraction; Learning; Learning systems; Measurement; Metric Learning; Networks; Neural networks; Pattern recognition; Thresholds; Training; Trains; Transformations; Vectors; Videos

This paper presents a new discriminative deep metric learning (DDML) method for face verification in the wild. Different from existing metric learning-based face verification methods which aim to learn a Mahalanobis distance metric to maximize the inter-class variations and minimize the intra-class...