Dielectric screening effect on exciton resonance energy in monolayer WS2 on SiO2/Si substrate

We studied the dielectric screening effects by a SiO2/Si substrate on the excitonic properties of monolayer WS2 by means of microscopic reflectance and photoluminescence spectroscopy. Through the observation of high-order exciton resonances from 1s to 5s at 10 K, we estimated the band gap and excito...

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Published inJournal of physics. Conference series Vol. 1220; no. 1
Main Authors Kajino, Yuto, Arai, Masaya, Oto, Kenichi, Yamada, Yasuhiro
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.05.2019
Subjects
Excitons
Mathematical analysis
Monolayers
Photoluminescence
Physics
Screening
Silicon dioxide
Silicon substrates
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Abstract We studied the dielectric screening effects by a SiO2/Si substrate on the excitonic properties of monolayer WS2 by means of microscopic reflectance and photoluminescence spectroscopy. Through the observation of high-order exciton resonances from 1s to 5s at 10 K, we estimated the band gap and exciton binding energy. Our theoretical calculation using the screened Keldysh potential well reproduced the high-order Rydberg energies. In addition, we discussed the deviation of oscillator strength obtained from experimental results in comparison with theoretical calculation.
AbstractList We studied the dielectric screening effects by a SiO2/Si substrate on the excitonic properties of monolayer WS2 by means of microscopic reflectance and photoluminescence spectroscopy. Through the observation of high-order exciton resonances from 1s to 5s at 10 K, we estimated the band gap and exciton binding energy. Our theoretical calculation using the screened Keldysh potential well reproduced the high-order Rydberg energies. In addition, we discussed the deviation of oscillator strength obtained from experimental results in comparison with theoretical calculation.
Author Arai, Masaya
Kajino, Yuto
Oto, Kenichi
Yamada, Yasuhiro
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  givenname: Masaya
  surname: Arai
  fullname: Arai, Masaya
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  organization: Department of Physics, Chiba University , Japan
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  givenname: Yasuhiro
  surname: Yamada
  fullname: Yamada, Yasuhiro
  email: yasuyamada@chiba-u.jp
  organization: Department of Physics, Chiba University , Japan
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Snippet We studied the dielectric screening effects by a SiO2/Si substrate on the excitonic properties of monolayer WS2 by means of microscopic reflectance and...
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SubjectTerms Excitons
Mathematical analysis
Monolayers
Photoluminescence
Physics
Screening
Silicon dioxide
Silicon substrates
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Title Dielectric screening effect on exciton resonance energy in monolayer WS2 on SiO2/Si substrate
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