APA (7th ed.) Citation

Yuki, D., Kim, H., Tan, J. K., Ishikawa, S., Tsukuda, M., & Omura, I. (2015, October). Development of a supporting system for visual inspection of IGBT device based on statistical feature and complex multi-resolution analysis. ICCAS : 2015 15th International Conference on Control, Automation and Systems : 13-16 October 2015, 1551-1554. https://doi.org/10.1109/ICCAS.2015.7364603

Chicago Style (17th ed.) Citation

Yuki, Daisuke, Hyoungseop Kim, Joo Kooi Tan, Seiji Ishikawa, Masanori Tsukuda, and Ichiro Omura. "Development of a Supporting System for Visual Inspection of IGBT Device Based on Statistical Feature and Complex Multi-resolution Analysis." ICCAS : 2015 15th International Conference on Control, Automation and Systems : 13-16 October 2015 Oct. 2015: 1551-1554. https://doi.org/10.1109/ICCAS.2015.7364603.

MLA (9th ed.) Citation

Yuki, Daisuke, et al. "Development of a Supporting System for Visual Inspection of IGBT Device Based on Statistical Feature and Complex Multi-resolution Analysis." ICCAS : 2015 15th International Conference on Control, Automation and Systems : 13-16 October 2015, Oct. 2015, pp. 1551-1554, https://doi.org/10.1109/ICCAS.2015.7364603.