Low-Bit Precision Neural Network Architecture with High Immunity to Variability and Random Telegraph Noise based on Resistive Memories - Zanotti, Tommaso; Puglisi, Francesco Maria; Pavan, Paolo (IEEE International Reliability Physics Symposium proceedings, 2021)
Keywords: Analytical models; BNN; Brain modeling; Compact Modeling; Computer architecture; Data models; Hardware; Resistance; Resistive RAM; RRAM; RTN