Electrically pumped, waveguide-coupled Si light emitting diodes

We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources and detectors.

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Bibliographic Details
Published in2017 Conference on Lasers and Electro-Optics (CLEO) pp. 1 - 2
Main Authors Buckley, S. M., Stevens, M. J., Nam, S. W., Mirin, R. P., Shainline, J. M.
Format Conference Proceeding
LanguageEnglish
Published The Optical Society 01.05.2017
Subjects
Detectors
Electroluminescence
Light emitting diodes
Optical device fabrication
Optical waveguides
Silicon
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Abstract We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources and detectors.
AbstractList We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources and detectors.
Author Buckley, S. M.
Mirin, R. P.
Nam, S. W.
Shainline, J. M.
Stevens, M. J.
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  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  givenname: M. J.
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  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  givenname: S. W.
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  fullname: Nam, S. W.
  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  givenname: J. M.
  surname: Shainline
  fullname: Shainline, J. M.
  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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Snippet We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources...
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SubjectTerms Detectors
Electroluminescence
Light emitting diodes
Optical device fabrication
Optical waveguides
Silicon
Title Electrically pumped, waveguide-coupled Si light emitting diodes
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