Electrically pumped, waveguide-coupled Si light emitting diodes

We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources and detectors.

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Published in2017 Conference on Lasers and Electro-Optics (CLEO) pp. 1 - 2
Main Authors Buckley, S. M., Stevens, M. J., Nam, S. W., Mirin, R. P., Shainline, J. M.
Format Conference Proceeding
LanguageEnglish
Published The Optical Society 01.05.2017
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Abstract We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources and detectors.
AbstractList We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources and detectors.
Author Buckley, S. M.
Mirin, R. P.
Nam, S. W.
Shainline, J. M.
Stevens, M. J.
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  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  givenname: M. J.
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  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  givenname: S. W.
  surname: Nam
  fullname: Nam, S. W.
  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  givenname: R. P.
  surname: Mirin
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  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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  givenname: J. M.
  surname: Shainline
  fullname: Shainline, J. M.
  organization: Nat. Inst. of Stand. & Technol., Boulder, CO, USA
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Snippet We describe fabrication and testing of LEDs based on emissive defect centers in Si and discuss our progress toward low-temperature on-chip integrated sources...
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StartPage 1
SubjectTerms Detectors
Electroluminescence
Light emitting diodes
Optical device fabrication
Optical waveguides
Silicon
Title Electrically pumped, waveguide-coupled Si light emitting diodes
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