Interface failure in lead free solder joints
The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder alloy, reflow conditions, and post reflow thermal aging were quantified. The joint strength ranged from 5 to 115MPa. The joint ductility drop...
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Published in | 56th Electronic Components and Technology Conference 2006 p. 12 pp. |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
2006
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Subjects | |
Online Access | Get full text |
ISBN | 1424401526 9781424401529 |
ISSN | 0569-5503 |
DOI | 10.1109/ECTC.2006.1645763 |
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Abstract | The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder alloy, reflow conditions, and post reflow thermal aging were quantified. The joint strength ranged from 5 to 115MPa. The joint ductility dropped to zero in some cases. The interface microstructure and failure mode were characterized for each combination of factors. Most of the trends were linked to microstructural features of the interface. A ductile-to-brittle transition strain rate (DTBTSR) was defined as a metric to quantify the performance of a specific joint relative to interface failure. The DTBTSR ranged from 10 -3 /sec to 10/sec for the conditions studied |
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AbstractList | The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder alloy, reflow conditions, and post reflow thermal aging were quantified. The joint strength ranged from 5 to 115MPa. The joint ductility dropped to zero in some cases. The interface microstructure and failure mode were characterized for each combination of factors. Most of the trends were linked to microstructural features of the interface. A ductile-to-brittle transition strain rate (DTBTSR) was defined as a metric to quantify the performance of a specific joint relative to interface failure. The DTBTSR ranged from 10 -3 /sec to 10/sec for the conditions studied |
Author | Darveaux, R. Islam, N. Reichman, C. |
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Snippet | The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder... |
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StartPage | 12 pp. |
SubjectTerms | Capacitive sensors Computer interfaces Electric shock Electronic equipment testing Environmentally friendly manufacturing techniques Lead Loading Packaging Sockets Soldering |
Title | Interface failure in lead free solder joints |
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