Interface failure in lead free solder joints

The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder alloy, reflow conditions, and post reflow thermal aging were quantified. The joint strength ranged from 5 to 115MPa. The joint ductility drop...

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Published in56th Electronic Components and Technology Conference 2006 p. 12 pp.
Main Authors Darveaux, R., Reichman, C., Islam, N.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2006
Subjects
Online AccessGet full text
ISBN1424401526
9781424401529
ISSN0569-5503
DOI10.1109/ECTC.2006.1645763

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Abstract The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder alloy, reflow conditions, and post reflow thermal aging were quantified. The joint strength ranged from 5 to 115MPa. The joint ductility dropped to zero in some cases. The interface microstructure and failure mode were characterized for each combination of factors. Most of the trends were linked to microstructural features of the interface. A ductile-to-brittle transition strain rate (DTBTSR) was defined as a metric to quantify the performance of a specific joint relative to interface failure. The DTBTSR ranged from 10 -3 /sec to 10/sec for the conditions studied
AbstractList The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder alloy, reflow conditions, and post reflow thermal aging were quantified. The joint strength ranged from 5 to 115MPa. The joint ductility dropped to zero in some cases. The interface microstructure and failure mode were characterized for each combination of factors. Most of the trends were linked to microstructural features of the interface. A ductile-to-brittle transition strain rate (DTBTSR) was defined as a metric to quantify the performance of a specific joint relative to interface failure. The DTBTSR ranged from 10 -3 /sec to 10/sec for the conditions studied
Author Darveaux, R.
Islam, N.
Reichman, C.
Author_xml – sequence: 1
  givenname: R.
  surname: Darveaux
  fullname: Darveaux, R.
  organization: Amkor Technol., Inc., Chandler, AZ
– sequence: 2
  givenname: C.
  surname: Reichman
  fullname: Reichman, C.
  organization: Amkor Technol., Inc., Chandler, AZ
– sequence: 3
  givenname: N.
  surname: Islam
  fullname: Islam, N.
  organization: Amkor Technol., Inc., Chandler, AZ
BookMark eNotj09LAzEUxANWsK39AOIlH8Bd38ufl92jLFULBS_1XNLkBVLWXcnWg9_eBXsaGIaZ36zEYhgHFuIBoUaE9nnbHbpaAVCNZKwjfSNWaJQxgFbRQizBUltZC_pObKbpDADYUkNNsxRPu-HCJfnAMvnc_xSWeZA9-yhTYZbT2Ecu8jzm4TLdi9vk-4k3V12Lz9ftoXuv9h9vu-5lX2Vl8FKdnEFUludVp9wpxnYGIUPBqkTa6UQhahNS1DMHIwXQbVDezhbPcafX4vG_NzPz8bvkL19-j9dz-g-rykMa
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/ECTC.2006.1645763
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
ExternalDocumentID 1645763
Genre orig-research
GroupedDBID -~X
29O
6IE
6IH
6IK
6IL
6IN
AAJGR
AAWTH
ABLEC
ADZIZ
AFFNX
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
IPLJI
M43
OCL
RIE
RIL
RIO
RNS
ZY4
ID FETCH-LOGICAL-i241t-b741125e569727bdd9015646c52f6373f6cd34cfd3019e16c039c2a54cfe7bd73
IEDL.DBID RIE
ISBN 1424401526
9781424401529
ISSN 0569-5503
IngestDate Wed Aug 27 02:31:26 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i241t-b741125e569727bdd9015646c52f6373f6cd34cfd3019e16c039c2a54cfe7bd73
ParticipantIDs ieee_primary_1645763
PublicationCentury 2000
PublicationDate 20060000
PublicationDateYYYYMMDD 2006-01-01
PublicationDate_xml – year: 2006
  text: 20060000
PublicationDecade 2000
PublicationTitle 56th Electronic Components and Technology Conference 2006
PublicationTitleAbbrev ECTC
PublicationYear 2006
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001968688
ssj0040018
Score 1.5363435
Snippet The phenomenon of interface failure in lead free solder joints was explored using solder joint array tensile testing. The effects of pad metallization, solder...
SourceID ieee
SourceType Publisher
StartPage 12 pp.
SubjectTerms Capacitive sensors
Computer interfaces
Electric shock
Electronic equipment testing
Environmentally friendly manufacturing techniques
Lead
Loading
Packaging
Sockets
Soldering
Title Interface failure in lead free solder joints
URI https://ieeexplore.ieee.org/document/1645763
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07b8IwED4BU7v0AVXfytCR8MglDp4RCFWi6gASG4rts5S2ChVNlv76npMAbdWhm21Zis85-z7fE-DBSEGKoYBvEPmBYhK-B5Mg9pW2CR8ngaZ8KM6fxGwZPq6iVQO6-1gYIiqdz6jnmqUt32x04VRlfYb2DI-xCU1msypW66BPkWIkRnsLQuiqzblbOBLSZxSOu6AuFn-B2OV6qvuyNncOB7I_GS_GlY2i_tqPsiul1JmewHy33srZ5LVX5KqnP3-lcvwvQafQOcT3ec97yXUGDcrO4fhbasI2dEtVoU14pk1S57vupZn3xhzh2S2RxyxraOu9bNIs_-jAcjpZjGd-XVnBT1li575iHMHIhnhzGL8oYxwqEKHQUWAFxmiFNhhqa_j4SxoKPUCpgyTiIeLpMV5AK9tkdAm8hkQLhgXKhUUhokTSsTAaI4Ux0egK2o7u9XuVPGNdk3z99_ANHB10HLfQyrcF3bHUz9V9-bu_AHKio1Q
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEJ4gHtSLDzC-7cEj5dFpt-yZYFCBeICEG-nuTpOqKQbLxV_vbFtAjQdv7WaT7rTb-b6dJ8CdkYIUUwHXIPIBxUSsByMvdJWOI_6dBJr8oDgai8HUf5wFswo0NrkwRJQHn1HTXua-fLPQK2sqazG1Z3qMO7DLuO8HRbbW1qIiRVd0Nz4E3_abs3o4ENJlHo7rtC4GQE-sqz2V97J0eHbastXvTXqFl6J83o_GKznu3B_CaL3iItzktbnKVFN__irm-F-RjqC-zfBznjfYdQwVSk_g4Ftxwho0cmNhHPHMOEps9LqTpM4b7wknXhI5vGkNLZ2XRZJmH3WY3vcnvYFb9lZwE8bszFXMJJjbEL8cZjDKGMsLhC904MUCQ4yFNujr2LACkNQRuo1Se1HAQ8TTQzyFarpI6Qx4DZEWTAyUTYxCRImkQ2E0BgpDou451Kzc8_eifMa8FPni7-Fb2BtMRsP58GH8dAn7W4vHFVSz5YqumQNk6ib_9F89Zaah
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=56th+Electronic+Components+and+Technology+Conference+2006&rft.atitle=Interface+failure+in+lead+free+solder+joints&rft.au=Darveaux%2C+R.&rft.au=Reichman%2C+C.&rft.au=Islam%2C+N.&rft.date=2006-01-01&rft.pub=IEEE&rft.isbn=9781424401529&rft.issn=0569-5503&rft.spage=12+pp.&rft_id=info:doi/10.1109%2FECTC.2006.1645763&rft.externalDocID=1645763
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0569-5503&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0569-5503&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0569-5503&client=summon