Cetin, J., & Balasinski, A. (2006, December). SoC Design Quality, Cycletime, and Yield Improvement Through DfM. 2006 6th International Workshop on Systemon Chip for Real Time Applications, 86-90. https://doi.org/10.1109/IWSOC.2006.348270
Chicago Style (17th ed.) CitationCetin, J., and A. Balasinski. "SoC Design Quality, Cycletime, and Yield Improvement Through DfM." 2006 6th International Workshop on Systemon Chip for Real Time Applications Dec. 2006: 86-90. https://doi.org/10.1109/IWSOC.2006.348270.
MLA (9th ed.) CitationCetin, J., and A. Balasinski. "SoC Design Quality, Cycletime, and Yield Improvement Through DfM." 2006 6th International Workshop on Systemon Chip for Real Time Applications, Dec. 2006, pp. 86-90, https://doi.org/10.1109/IWSOC.2006.348270.
Warning: These citations may not always be 100% accurate.