A macromodelling methodology for efficient high-level simulation of substrate noise generation
Efficient prediction of the substrate noise generated by digital sections is currently a major challenge in system-on-a-chip design. In this paper a macromodel to accurately and efficiently predict the substrate noise generated by digital standard cells is presented. The macromodel accuracy is demon...
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Published in | Proceedings Design, Automation and Test in Europe Conference and Exhibition Vol. 2; pp. 1362 - 1363 Vol.2 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
2004
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Subjects | |
Online Access | Get full text |
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