Analysis of process dependent mechanical properties of sintered copper nanoparticle pillars for the plating-free bumping by finite element method

Previous studies of sintered copper nanoparticles used in the plating-free bumping by injection molded solder (IMS) have shown that their microstructural features depend on the sintering conditions such as temperature and gas atmosphere. The other study has shown that the elastic modulus and yield o...

Full description

Saved in:
Bibliographic Details
Published inInterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems pp. 1 - 8
Main Authors Kohara, Sayuri, Aoki, Toyohiro, Marushima, Chinami, Taylor, Christine, Sueoka, Kuniaki, Hisada, Takashi
Format Conference Proceeding
LanguageEnglish
Japanese
Published IEEE 31.05.2022
Subjects
Online AccessGet full text
ISSN2694-2135
DOI10.1109/iTherm54085.2022.9899672

Cover

Loading…
Abstract Previous studies of sintered copper nanoparticles used in the plating-free bumping by injection molded solder (IMS) have shown that their microstructural features depend on the sintering conditions such as temperature and gas atmosphere. The other study has shown that the elastic modulus and yield of sintered Cu nanoparticles (NPs) also depend on the sintering temperature. In this report, the relationships between the morphological features and elastic modulus of sintered Cu nanoparticles is studied by nanoindentation and by finite element method (FEM). Mechanical testing by nanoindentation revealed that the elastic modulus of sintered Cu nanoparticles depends not only on the sintering temperature, but also on the sintering gas atmosphere. The results together with the previous study on the microstructures indicate that the Cu NPs processed in nitrogen and those processed in formic acid are at the different stages of coalescence and void growth dynamics. Young's modulus values of sintered Cu nanoparticles processed in formic acid were higher than those processed in nitrogen for the same sintering temperatures. The values of Young's modulus for the sintering temperatures of 150, 200 and 250°C were 66, 71 and 86 GPa for the nitrogen case and 82, 100 and 99 GPa for the formic acid case, respectively. The reference value for the plated copper was 138 GPa. To elucidate the relationship between the morphological features and the mechanical properties, Young's modulus and yield were calculated by numerical testing of representative volume elements constructed with morphological features using FEM. Morphological features used for the analyses were neck width and the void ratio which are associated with the particle coalescence and the void growth respectively. The calculation showed that an increase in the neck width results in an increase of Young's modulus and yield whereas an increase in void ratio results in a decrease of Young's modulus and yield. Evolution of Young's modulus with sintering temperature was compared with that obtained by nanoindentation. For the formic acid case, the variation of Young's modulus was best described by a hierarchical model incorporating both the neck width and the void ratio suggesting that both the particle coalescence and the void growth are important dynamics determining the mechanical properties for this system. Statistical analysis was also performed on the Young's modulus data randomly generated by FEM to determine the relative influence of the morphological features on elastic modulus.
AbstractList Previous studies of sintered copper nanoparticles used in the plating-free bumping by injection molded solder (IMS) have shown that their microstructural features depend on the sintering conditions such as temperature and gas atmosphere. The other study has shown that the elastic modulus and yield of sintered Cu nanoparticles (NPs) also depend on the sintering temperature. In this report, the relationships between the morphological features and elastic modulus of sintered Cu nanoparticles is studied by nanoindentation and by finite element method (FEM). Mechanical testing by nanoindentation revealed that the elastic modulus of sintered Cu nanoparticles depends not only on the sintering temperature, but also on the sintering gas atmosphere. The results together with the previous study on the microstructures indicate that the Cu NPs processed in nitrogen and those processed in formic acid are at the different stages of coalescence and void growth dynamics. Young's modulus values of sintered Cu nanoparticles processed in formic acid were higher than those processed in nitrogen for the same sintering temperatures. The values of Young's modulus for the sintering temperatures of 150, 200 and 250°C were 66, 71 and 86 GPa for the nitrogen case and 82, 100 and 99 GPa for the formic acid case, respectively. The reference value for the plated copper was 138 GPa. To elucidate the relationship between the morphological features and the mechanical properties, Young's modulus and yield were calculated by numerical testing of representative volume elements constructed with morphological features using FEM. Morphological features used for the analyses were neck width and the void ratio which are associated with the particle coalescence and the void growth respectively. The calculation showed that an increase in the neck width results in an increase of Young's modulus and yield whereas an increase in void ratio results in a decrease of Young's modulus and yield. Evolution of Young's modulus with sintering temperature was compared with that obtained by nanoindentation. For the formic acid case, the variation of Young's modulus was best described by a hierarchical model incorporating both the neck width and the void ratio suggesting that both the particle coalescence and the void growth are important dynamics determining the mechanical properties for this system. Statistical analysis was also performed on the Young's modulus data randomly generated by FEM to determine the relative influence of the morphological features on elastic modulus.
Author Sueoka, Kuniaki
Marushima, Chinami
Kohara, Sayuri
Taylor, Christine
Aoki, Toyohiro
Hisada, Takashi
Author_xml – sequence: 1
  givenname: Sayuri
  surname: Kohara
  fullname: Kohara, Sayuri
  email: sayurik@jp.ibm.com
  organization: IBM-Research Tokyo,Kawasaki,Japan
– sequence: 2
  givenname: Toyohiro
  surname: Aoki
  fullname: Aoki, Toyohiro
  organization: IBM-Research Tokyo,Kawasaki,Japan
– sequence: 3
  givenname: Chinami
  surname: Marushima
  fullname: Marushima, Chinami
  organization: IBM-Research Tokyo,Kawasaki,Japan
– sequence: 4
  givenname: Christine
  surname: Taylor
  fullname: Taylor, Christine
  organization: IBM Corporation,Packaging Labs and Modeling, Systems,NY
– sequence: 5
  givenname: Kuniaki
  surname: Sueoka
  fullname: Sueoka, Kuniaki
  organization: IBM-Research Tokyo,Kawasaki,Japan
– sequence: 6
  givenname: Takashi
  surname: Hisada
  fullname: Hisada, Takashi
  organization: IBM-Research Tokyo,Kawasaki,Japan
BookMark eNotkE1OwzAQhQ0CibZwAja-QIp_YjdZVhV_UiU2ZV1N7DExcpzINosegxsToKun977RjOYtyVUcIxJCOVtzztoHf-gxDapmjVoLJsS6bdpWb8QFWXKtVd0oJtUlWQjd1pXgUt2QZc6fjMmZsgX53kYIp-wzHR2d0mgwZ2pxwmgxFjqg6SF6A-EXTpiKx7_R7GPBhJaacZpjGiGOE8zYBKSTDwFSpm5MtPSzD1B8_KhcQqTd1zDNhnYn6nz0BSkGHP6PlX60t-TaQch4d9YVeX96POxeqv3b8-tuu6_8_EapUCE0Na-t3JimsaAkA2bRtcp0sjNaa2ZQo3G6NgCOcw0OALgVNbiNQLki9_97PSIep-QHSKfjuT75A2arbfA
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/iTherm54085.2022.9899672
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1665485035
9781665485036
EISSN 2694-2135
EndPage 8
ExternalDocumentID 9899672
Genre orig-research
GroupedDBID 29Q
6IE
6IF
6IH
6IK
6IL
6IM
6IN
AAJGR
AAWTH
ABLEC
ACGFS
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
IPLJI
M43
OCL
RIE
RIL
RIO
RNS
ID FETCH-LOGICAL-i213t-e5ea8414d37c88da530a0def95cb3bc6660ce6ecf64caaf116afaaa1d24af72e3
IEDL.DBID RIE
IngestDate Wed Aug 27 02:27:08 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i213t-e5ea8414d37c88da530a0def95cb3bc6660ce6ecf64caaf116afaaa1d24af72e3
PageCount 8
ParticipantIDs ieee_primary_9899672
PublicationCentury 2000
PublicationDate 2022-05-31
PublicationDateYYYYMMDD 2022-05-31
PublicationDate_xml – month: 05
  year: 2022
  text: 2022-05-31
  day: 31
PublicationDecade 2020
PublicationTitle InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems
PublicationTitleAbbrev iTherm
PublicationYear 2022
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0036650
Score 2.1848164
Snippet Previous studies of sintered copper nanoparticles used in the plating-free bumping by injection molded solder (IMS) have shown that their microstructural...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Cu nanoparticles
Data models
FEM
Finite element analysis
IMS
Mechanical factors
nanoindentation
Nanoparticles
Sintering
Temperature
Temperature dependence
Title Analysis of process dependent mechanical properties of sintered copper nanoparticle pillars for the plating-free bumping by finite element method
URI https://ieeexplore.ieee.org/document/9899672
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT4NAEN7UnvTiozW-MwePQnksC5yNTWOi8WCT3prdZdY0pkAoPei_8B87C6U-4sEbLBDIzGT3G_abbxi7VtyEnEvPSTnPHM5ROWksE0cbWq4JckRCNwTZRzGZ8vtZNOuxm20tDCI25DN07WGzl58Vem1_lY1SSg5ETBPuDiVuba1WN-uGgqBGx9Tx0tGCrFwtI6vfRUlgELibZ380UWnWkPE-e-je3lJHXt11rVz9_kuY8b-fd8CGX9V68LRdhw5ZD_MjtvdNaHDAPjrtESgMlG1tAHT9b2tYoq3_te6yF0tLtcbm1pVVk6gwA12UNAy5zCnJboMNStuwqFoBwV4gGAmlpdXlL46pEEFRmNAJqDcwC4trAVuiOrQ9q4dsOr57vp04m2YMziLww9rBCGXCfZ6FsU6STEahJ70MTRppFSpNWZCnUaA2gmspje8LaaSUfhZwaeIAw2PWz4scTxhopWKVGiToEnMTqSTRkSRPSYNGKk-csoE17rxs9TbmG7ue_T18znatg9sd_QvWr6s1XhJQqNVVEyGfqbnE4g
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8MwDI4mOAAXXkO88YEjLX0kfZwRaMBAHEDabUpSB02Ituq6A_wL_jFOu46HOHBr06dsK_6cfLYZO1XchJxLz0k5zxzOUTlpLBNHG3LXBDlEpBuC7H00eOI3IzHqsbNFLgwiNuQzdO1hs5efFXpml8rOUwoOopgm3GV6kfDbbK1u3g0jAhsdV8dLzyck5-pV2ApeFAYGgTt_-kcblcaLXK2zu-77LXnkxZ3VytXvv0oz_vcHN1j_K18PHhaeaJP1MN9ia99KDW6zj676CBQGyjY7ALoOuDW8os0AtgqzF0tLtsbm1qmtJ1FhBrooaRhymVOY3ZoblLZlUTUFAr5AQBJKS6zLnx1TIYIiQ6ETUG9gJhbZArZUdWi7VvfZ09Xl48XAmbdjcCaBH9YOCpQJ93kWxjpJMilCT3oZmlRoFSpNcZCnMUJtIq6lNL4fSSOl9LOASxMHGO6wpbzIcZeBVipWqUECLzE3QiWJFpI0JQ0aqbxoj21b4Y7LtuLGeC7X_b-HT9jK4PFuOB5e398esFWr7HZ__5At1dUMjwg21Oq4sZZPEFLIKw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=InterSociety+Conference+on+Thermal+and+Thermomechanical+Phenomena+in+Electronic+Systems&rft.atitle=Analysis+of+process+dependent+mechanical+properties+of+sintered+copper+nanoparticle+pillars+for+the+plating-free+bumping+by+finite+element+method&rft.au=Kohara%2C+Sayuri&rft.au=Aoki%2C+Toyohiro&rft.au=Marushima%2C+Chinami&rft.au=Taylor%2C+Christine&rft.date=2022-05-31&rft.pub=IEEE&rft.eissn=2694-2135&rft.spage=1&rft.epage=8&rft_id=info:doi/10.1109%2FiTherm54085.2022.9899672&rft.externalDocID=9899672