Measurement-based worst-case execution time analysis
In the last years the number of electronic control systems has increased significantly. In order to stay competitive more and more functionality is integrated into more and more powerful and complex computer hardware. Due to these advances in control systems engineering new challenges for analyzing...
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Published in | Third IEEE Workshop on Software Technologies for Future Embedded and Ubiquitous Systems (SEUS'05) pp. 7 - 10 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
2005
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Subjects | |
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Abstract | In the last years the number of electronic control systems has increased significantly. In order to stay competitive more and more functionality is integrated into more and more powerful and complex computer hardware. Due to these advances in control systems engineering new challenges for analyzing the timing behavior of real-time computer systems arise. The two identified main challenges are execution-time modeling of the hardware and the path problem that forbids capturing the worst-case execution time (WCET) by end-to-end measurements due to limits in computational complexity. This work presents the cornerstones of our new measurement-based WCET analysis method that successfully addresses these problems. We clearly identify our research goals and the relevance of our research. Especially, the novel aspects of our approach are emphasized. The conclusion is formed by a brief presentation of an industrial-size case study application. |
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AbstractList | In the last years the number of electronic control systems has increased significantly. In order to stay competitive more and more functionality is integrated into more and more powerful and complex computer hardware. Due to these advances in control systems engineering new challenges for analyzing the timing behavior of real-time computer systems arise. The two identified main challenges are execution-time modeling of the hardware and the path problem that forbids capturing the worst-case execution time (WCET) by end-to-end measurements due to limits in computational complexity. This work presents the cornerstones of our new measurement-based WCET analysis method that successfully addresses these problems. We clearly identify our research goals and the relevance of our research. Especially, the novel aspects of our approach are emphasized. The conclusion is formed by a brief presentation of an industrial-size case study application. |
Author | Puschner, P. Rieder, B. Kirner, R. Wenzel, I. |
Author_xml | – sequence: 1 givenname: I. surname: Wenzel fullname: Wenzel, I. organization: Inst. for Comput. Eng., Vienna Univ. of Technol., Austria – sequence: 2 givenname: R. surname: Kirner fullname: Kirner, R. organization: Inst. for Comput. Eng., Vienna Univ. of Technol., Austria – sequence: 3 givenname: B. surname: Rieder fullname: Rieder, B. organization: Inst. for Comput. Eng., Vienna Univ. of Technol., Austria – sequence: 4 givenname: P. surname: Puschner fullname: Puschner, P. organization: Inst. for Comput. Eng., Vienna Univ. of Technol., Austria |
BookMark | eNotjLFOwzAQQC0BElCysbHkBxJ8ti8Xj6gqFKmIoWWuLvFFMmoSFKeC_j2V4C3vTe9WXQ7jIErdgy4BtH_crj62pdEaSzAXKvNUa6o8GotUXasspU99xvrKAdwo9yacjpP0MsxFw0lC_j1OaS7ac-fyI-1xjuOQz7GXnAc-nFJMd-qq40OS7N8LtXte7ZbrYvP-8rp82hTRgJ0Lw414MhyoadBK1SGGqgYy6AOw64wTNtY6pEAtOQgmCDGj5brtarIL9fC3jSKy_5piz9NpD86gtmh_AXwnRQc |
ContentType | Conference Proceeding |
DBID | 6IE 6IL CBEJK RIE RIL |
DOI | 10.1109/SEUS.2005.12 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Xplore IEEE Proceedings Order Plans (POP All) 1998-Present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Computer Science |
EndPage | 10 |
ExternalDocumentID | 1425035 |
Genre | orig-research |
GroupedDBID | 6IE 6IF 6IK 6IL 6IN AAJGR AARBI ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK OCL RIE RIL |
ID | FETCH-LOGICAL-i213t-2abe972ad7bb53e6f55d6817259d1a4f24ea233457d7c741d2de7aa53a8cf873 |
IEDL.DBID | RIE |
ISBN | 9780769523576 0769523579 |
IngestDate | Wed Jun 26 19:21:21 EDT 2024 |
IsDoiOpenAccess | false |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i213t-2abe972ad7bb53e6f55d6817259d1a4f24ea233457d7c741d2de7aa53a8cf873 |
OpenAccessLink | http://uhra.herts.ac.uk/bitstream/2299/6270/1/905614.pdf |
PageCount | 4 |
ParticipantIDs | ieee_primary_1425035 |
PublicationCentury | 2000 |
PublicationDate | 20050000 |
PublicationDateYYYYMMDD | 2005-01-01 |
PublicationDate_xml | – year: 2005 text: 20050000 |
PublicationDecade | 2000 |
PublicationTitle | Third IEEE Workshop on Software Technologies for Future Embedded and Ubiquitous Systems (SEUS'05) |
PublicationTitleAbbrev | WSTFES |
PublicationYear | 2005 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0000396411 |
Score | 1.493652 |
Snippet | In the last years the number of electronic control systems has increased significantly. In order to stay competitive more and more functionality is integrated... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 7 |
SubjectTerms | Computational complexity Control systems Hardware Power engineering and energy Power engineering computing Power system modeling Real time systems Systems engineering and theory Time measurement Timing |
Title | Measurement-based worst-case execution time analysis |
URI | https://ieeexplore.ieee.org/document/1425035 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB7anjxVbcU3OXg0bZJ9n6WlCBGhLfRW9jEBEVqRFMVf726SpiIevIRNTrubWWbm25nvA7jTwjJKjIqt8ekqTRzGmhfUPxxnKRaFpaHfOX_isyV9XLFVB-7bXhhErIrPcBSG1V2-29pdgMrGqTewhLAudIVSda9Wi6ckRHGapnVmrlhgcVENwc7-nbeF72o8nyznNaIStCh_CKtUfmXah3w_o7qc5HW0K83Ifv0ia_zvlI9heOjgi55b33QCHdycQn8v4RA1J3oAND9ghHHwaC762PqAMLZ-HOEn2sowoyBBH-mGwGQIi-lk8TCLGyGF-CVLSRln2qASmXbCGEaQF4w5Ln3owpRLNS0yijojhDLhhPUhhsscCq0Z0dIWUpAz6G22GzyHSCZKoM8YURY-p5ZUO55QRzVKYqhOzQUMwh6s32qqjHWz_Mu_P1_BUcWEWiEa19Ar33d44318aW6rn_sNn8CjmQ |
link.rule.ids | 310,311,783,787,792,793,799,4059,4060,27939,55088 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwED6VMsBUoEW8ycBI2iR-xTMqKtBWSG2lbpUfFwkhtQilAvHrsZM0RYiBxbI92bGtu_ty930AN0oYRomWodEuXKWRxVDxjLrGchZjlhnq651HYz6Y0cc5mzfgtq6FQcQi-Qy7vlv8y7crs_ZQWS92FywibAd2mfcrymqtGlGJiOQ0jsvYXDLP4yIrip3NmNep77I36c8mJabi1Sh_SKsUluW-BaPNmsqEktfuOtdd8_WLrvG_iz6AzraGL3iurdMhNHB5BK2NiENQvek20NEWJQy9TbPBx8q5hKFx_QA_0RRXM_Ai9IGqKEw6ML3vT-8GYSWlEL4kMcnDRGmUIlFWaM0I8owxy1PnvDBpY0WzhKJKCKFMWGGck2ETi0IpRlRqslSQY2guV0s8gSCNpEAXM2Kauag6pcryiFqqMCWaqlifQtt_g8VbSZaxqLZ_9vf0NewNpqPhYvgwfjqH_YIXtcA3LqCZv6_x0ln8XF8VB_0NZymm5g |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Third+IEEE+Workshop+on+Software+Technologies+for+Future+Embedded+and+Ubiquitous+Systems+%28SEUS%2705%29&rft.atitle=Measurement-based+worst-case+execution+time+analysis&rft.au=Wenzel%2C+I.&rft.au=Kirner%2C+R.&rft.au=Rieder%2C+B.&rft.au=Puschner%2C+P.&rft.date=2005-01-01&rft.pub=IEEE&rft.isbn=9780769523576&rft.spage=7&rft.epage=10&rft_id=info:doi/10.1109%2FSEUS.2005.12&rft.externalDocID=1425035 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780769523576/lc.gif&client=summon&freeimage=true |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780769523576/mc.gif&client=summon&freeimage=true |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780769523576/sc.gif&client=summon&freeimage=true |