Design of Testable Adder Circuits for Spintronics Based Nanomagnetic Computing - Labrado, Carson; Thapliyal, Himanshu; DeMara, Ronald F. (2015 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS), 2015)
Keywords: Adders; Circuit faults; Delays; Design methodology; Fredkin gate; Inverters; Logic gates; Nanomagnetic Logic Computing; reversible logic; Spintronics; Wires