Quality improvement of analog circuits fault diagnosis based on ANN using clusterization as preprocessing

• Published in: 2015 IEEE East-West Design & Test Symposium (EWDTS) pp. 1 - 4
• Main Author: Mosin, Sergey
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.09.2015
• Subjects: Analog circuits; Artificial neural networks; Circuit faults; classification; clustering; Fault diagnosis; neural networks; Neurons; Training

The technique of improvement the fault diagnosis quality of analog circuits using artificial neural network is proposed. The technique is based on combining the methods of clustering and classification the output circuits responses taking into consideration component tolerances at data preparation a...