Diagnosis of Quantum Circuits in the NISQ Era

• Published in: Proceedings - IEEE VLSI Test Symposium pp. 1 - 7
• Main Authors: Li, Yu-Min, Hsieh, Cheng-Yun, Li, Yen-Wei, Li, James Chien-Mo
• Format: Conference Proceeding
• Language: English
• Published: IEEE 24.04.2023
• Subjects: Benchmark testing; Dictionaries; fault diagnosis; Fault location; noisy intermediate-scale quantum; Performance evaluation; Probability distribution; quantum circuit; Simulation; Very large scale integration

Currently, noisy intermediate-scale quantum (NISQ) circuits may not always generate correct outputs due to noise and faults. In this work, we propose a diagnosis technique for NISQ circuits. The proposed technique contains static diagnosis and dynamic diagnosis. Static diagnosis uses a fault diction...