Development of Machine Vision System for Detection of Wrap-Around in n-TOPCon Solar Cells - Kim, Junhee; Kim, Han-Jung; Ko, Yohan; Kim, Yoonkap (2023 IEEE 50th Photovoltaic Specialists Conference (PVSC), 2023)
Keywords: Machine vision; machine vision system; Microscopy; n-TOPCon; Optical losses; Optical microscopy; Photovoltaic cells; Photovoltaic systems; Production; wrap-around