A Test System Meeting Requirements Under Normal and Contingency Conditions at Multiple Loadings for Transmission Expansion Planning
This paper introduces a high-voltage test system tailored specifically for transmission expansion planning (TEP). The network incorporates long transmission lines, and the line series impedance and shunt admittance for each line are computed utilizing the equivalent \pi circuit model for long transm...
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Published in | Circuits and Systems Workshop (DCAS), Proceedings of the IEEE Dallas pp. 1 - 6 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
19.04.2024
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Abstract | This paper introduces a high-voltage test system tailored specifically for transmission expansion planning (TEP). The network incorporates long transmission lines, and the line series impedance and shunt admittance for each line are computed utilizing the equivalent \pi circuit model for long transmission lines to account for the distributed nature of line parameters. The proposed test system offers technically feasible load flow solutions under normal and all single contingency conditions for three distinct loading scenarios: peak, dominant, and light loading conditions. As the real power system is subject to various loading scenarios and should be effectively operable under all conditions, this test system accurately replicates the properties of real power systems. The test system introduced in this paper can be a valuable resource for TEP research. |
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AbstractList | This paper introduces a high-voltage test system tailored specifically for transmission expansion planning (TEP). The network incorporates long transmission lines, and the line series impedance and shunt admittance for each line are computed utilizing the equivalent \pi circuit model for long transmission lines to account for the distributed nature of line parameters. The proposed test system offers technically feasible load flow solutions under normal and all single contingency conditions for three distinct loading scenarios: peak, dominant, and light loading conditions. As the real power system is subject to various loading scenarios and should be effectively operable under all conditions, this test system accurately replicates the properties of real power systems. The test system introduced in this paper can be a valuable resource for TEP research. |
Author | Ghassemi, Mona Dhamala, Bhuban |
Author_xml | – sequence: 1 givenname: Bhuban surname: Dhamala fullname: Dhamala, Bhuban email: bhuban.dhamala@utdallas.edu organization: The University of Texas at Dallas,Zero Emission, Realization of Optimized Energy Systems (ZEROES) Laboratory,Department of Electrical and Computer Engineering,Richardson,TX,USA – sequence: 2 givenname: Mona surname: Ghassemi fullname: Ghassemi, Mona email: mona.ghassemi@utdallas.edu organization: The University of Texas at Dallas,Zero Emission, Realization of Optimized Energy Systems (ZEROES) Laboratory,Department of Electrical and Computer Engineering,Richardson,TX,USA |
BookMark | eNo1kF1LwzAYhaMoOOf-gWD-QGe-m1yOOj9gU3Hb9UibtxJp09lk4K7943aoV-c58HAuziU6C10AhG4omVJKzO1dMVspSqWZMsLElBLJjTbyBE1MbjSXhAsjuTxFI5YrlUmq1QWaxPhBCOGEEkL1CH3P8BpiwqtDTNDiJUDy4R2_wefe99BCSBFvgoMeP3d9axtsg8NFF44WhOpwZOeT70LENuHlvkl-1wBedNYNSsR11-N1b0NsfYyDhudfu6Ed6bWxIQzSFTqvbRNh8pdjtLmfr4vHbPHy8FTMFplnRKTMUFXl0vJal65UwkkgJXV1TWkJoEA6BqyyWueVYoIYLlwuaV0xJ6gROhd8jK5_dz0AbHe9b21_2P7_xn8AUxRmqg |
ContentType | Conference Proceeding |
DBID | 6IE 6IL CBEJK RIE RIL |
DOI | 10.1109/DCAS61159.2024.10539895 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Xplore POP ALL IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP All) 1998-Present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISBN | 9798350349535 |
EISSN | 2766-5186 |
EndPage | 6 |
ExternalDocumentID | 10539895 |
Genre | orig-research |
GrantInformation_xml | – fundername: National Science Foundation (NSF) grantid: 2306098 funderid: 10.13039/100000001 |
GroupedDBID | 6IE 6IF 6IH 6IK 6IL 6IM 6IN AAJGR ABLEC ADZIZ ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO IEGSK IPLJI OCL RIE RIL |
ID | FETCH-LOGICAL-i204t-916c75a3f8bdb64d5e0b1dff11bee6e5d2e2ca887c6240934d751fc2d41948743 |
IEDL.DBID | RIE |
IngestDate | Wed Aug 27 02:04:44 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i204t-916c75a3f8bdb64d5e0b1dff11bee6e5d2e2ca887c6240934d751fc2d41948743 |
PageCount | 6 |
ParticipantIDs | ieee_primary_10539895 |
PublicationCentury | 2000 |
PublicationDate | 2024-April-19 |
PublicationDateYYYYMMDD | 2024-04-19 |
PublicationDate_xml | – month: 04 year: 2024 text: 2024-April-19 day: 19 |
PublicationDecade | 2020 |
PublicationTitle | Circuits and Systems Workshop (DCAS), Proceedings of the IEEE Dallas |
PublicationTitleAbbrev | DCAS |
PublicationYear | 2024 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0003010018 |
Score | 1.8923471 |
Snippet | This paper introduces a high-voltage test system tailored specifically for transmission expansion planning (TEP). The network incorporates long transmission... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1 |
SubjectTerms | Contingency management dominant loading High-voltage techniques light loading load flow analysis Loading peak loading Planning Power System Power system reliability Power transmission lines single contingency conditions Technical requirements test system transmission expansion planning |
Title | A Test System Meeting Requirements Under Normal and Contingency Conditions at Multiple Loadings for Transmission Expansion Planning |
URI | https://ieeexplore.ieee.org/document/10539895 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEA62J734qvgmB6-7bnaTbHMstaWILaIt9FbyBFFasVtQr_5xJ9nd-gDB27DLQshO5pXvm0HoIudCcp3mkWFaR1QQFwnKTKSUhPhYWjDLnpw8HPHBhF5P2bQiqwcuDLwN4DMbezHc5ZuFXvlSGZxwlom2YA3UgMytJGutCyqgqX7CXIXhIom4vOp27jlEPJ6PktK4_vrHHJXgRvrbaFQvoESPPMarQsX6_Vdvxn-vcAe1vhh7-Hbti3bRhp3voa1vzQb30UcHj8EF4LJHOR7aQHbGd9ZjgUORcInDFCQ88nHsE5Zzg33zqkC_0m9eNiXAC8sCDyskIr5ZBBj-EkP4i4PrA9XxNTjcewVTE6R6NFILTfq9cXcQVSMYooc0oQWYQq5zJjPXVkZxaphNFDHOEaKs5ZaZ1KZagqHSHEIDkVGTM-J0aigRkArR7AA154u5PUTYw28MJF_OZZASEim1S4zOaC4zKVXSPkItv5-z57LLxqzeyuM_np-gTf9b_c0OEaeoWbys7BkECIU6D4rxCfZbveU |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEF60HtSLr4pv9-A1NZvsJt1jqS1VmyDagreyr4AoqdgU1Kt_3NlNUh8geBsSAstmdl77fTMIncURF5EKYk8zpTzKSeZxyrQnpYD4WBgwy5acnKTRYEyv7tl9RVZ3XBh468BnpmVFd5evp2puS2VwwlnI25wtoxVw_Cwo6VqLkgroqp0xV6G4iM_PL7qduwhiHstICWir_v7HJBXnSPobKK2XUOJHHlvzQrbU-6_ujP9e4yZqfnH28M3CG22hJZNvo_Vv7QZ30EcHj8AJ4LJLOU6MozvjW2PRwK5MOMNuDhJObST7hEWusW1f5QhY6s3KuoR4YVHgpMIi4uHUAfFnGAJg7JwfKI-twuHeKxgbJ9XDkZpo3O-NugOvGsLgPQQ-LcAYRipmIszaUsuIamZ8SXSWESKNiQzTgQmUAFOlIggOeEh1zEimAk0Jh2SIhruokU9zs4ewBeBoSL-yLISkkAihMl-rkMYiFEL67X3UtPs5eS77bEzqrTz44_kpWh2MkuFkeJleH6I1-4vtPQ_hR6hRvMzNMYQLhTxxSvIJCjfBLw |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Circuits+and+Systems+Workshop+%28DCAS%29%2C+Proceedings+of+the+IEEE+Dallas&rft.atitle=A+Test+System+Meeting+Requirements+Under+Normal+and+Contingency+Conditions+at+Multiple+Loadings+for+Transmission+Expansion+Planning&rft.au=Dhamala%2C+Bhuban&rft.au=Ghassemi%2C+Mona&rft.date=2024-04-19&rft.pub=IEEE&rft.eissn=2766-5186&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FDCAS61159.2024.10539895&rft.externalDocID=10539895 |