Fast Overcurrent Protection for Direct Drive Cascode GaN HEMT Semiconductors Based on Industrial Gate Drivers - Vico, Enrico; Stella, Fausto; Giuffrida, Simone; Bojoi, Radu (Conference proceedings - IEEE Applied Power Electronics Conference and Exposition, 2024)
Keywords: DESAT; GaN; Gate drivers; HEMTs; MOSFET; Overcurrent Protection; Resistance; Temperature sensors; Time measurement; Voltage measurement; WBG; Wide Bandgap Semiconductors